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Colin T. Farrell
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Green Valley, AZ, US
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Patents Grants
last 30 patents
Information
Patent Grant
Automated re-focusing of interferometric reference mirror
Patent number
9,664,501
Issue date
May 30, 2017
Bruker Nano Inc.
Erik Novak
G01 - MEASURING TESTING
Information
Patent Grant
Automated re-focusing of interferometric reference mirror
Patent number
9,234,814
Issue date
Jan 12, 2016
Bruker Nano Inc.
Erik Novak
G01 - MEASURING TESTING
Information
Patent Grant
Tilt minimization through intensity control of light source
Patent number
9,097,517
Issue date
Aug 4, 2015
Bruker Nano Inc.
Colin Farrell
G01 - MEASURING TESTING
Information
Patent Grant
Focus assist through intensity control of light source
Patent number
8,519,314
Issue date
Aug 27, 2013
Bruker Nano Inc.
Colin Farrell
G01 - MEASURING TESTING
Information
Patent Grant
Variable-wavelength illumination system for interferometry
Patent number
7,654,685
Issue date
Feb 2, 2010
Veeco Instruments, Inc.
Der-Shen Wan
G01 - MEASURING TESTING
Information
Patent Grant
Microscope with fixed-element autocollimator for tilt adjustment
Patent number
7,016,050
Issue date
Mar 21, 2006
Veeco Instruments Inc.
Colin T. Farrell
G01 - MEASURING TESTING
Information
Patent Grant
Alignment and correction template for optical profilometric measure...
Patent number
6,847,460
Issue date
Jan 25, 2005
Veeco Instruments, Inc.
Colin T. Farrell
G11 - INFORMATION STORAGE
Information
Patent Grant
Reduced noise sensitivity method and apparatus for converting an in...
Patent number
6,738,511
Issue date
May 18, 2004
Veeco Instruments, Inc.
Colin T. Farrell
G01 - MEASURING TESTING
Information
Patent Grant
Alignment of magnetic heads for automatic identification of regions...
Patent number
6,459,489
Issue date
Oct 1, 2002
Veeco Instruments, Inc.
Colin T. Farrell
G11 - INFORMATION STORAGE
Patents Applications
last 30 patents
Information
Patent Application
AUTOMATED RE-FOCUSING OF INTERFEROMETRIC REFERENCE MIRROR
Publication number
20160123719
Publication date
May 5, 2016
ERIK NOVAK
G01 - MEASURING TESTING
Information
Patent Application
TILT MINIMIZATION THROUGH INTENSITY CONTROL OF LIGHT SOURCE
Publication number
20130314718
Publication date
Nov 28, 2013
COLIN FARRELL
G02 - OPTICS
Information
Patent Application
Variable-wavelength illumination system for interferometry
Publication number
20080218999
Publication date
Sep 11, 2008
VEECO INSTRUMENTS, INC.
Der-Shen Wan
G01 - MEASURING TESTING
Information
Patent Application
Microscope with fixed-element autocollimator for tilt adjustment
Publication number
20040218191
Publication date
Nov 4, 2004
Colin T. Farrell
G02 - OPTICS
Information
Patent Application
Alignment and correction template for optical profilometric measure...
Publication number
20030035115
Publication date
Feb 20, 2003
Colin T. Farrell
G11 - INFORMATION STORAGE