Colm Patrick Heffernan

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Annacotty, IE

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device configured for gate dielectric monitoring
- Patent number 12,032,014
- Issue date Jul 9, 2024
- Analog Devices International Unlimited Company
- Edward John Coyne
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wear-out monitor device
- Patent number 10,794,950
- Issue date Oct 6, 2020
- Analog Devices Global
- Edward John Coyne
- G01 - MEASURING TESTING
Information Patent Grant
Wear-out monitor device
- Patent number 10,365,322
- Issue date Jul 30, 2019
- Analog Devices Global
- Edward John Coyne
- G01 - MEASURING TESTING
Information Patent Grant
Wear-out monitor device
- Patent number 10,338,132
- Issue date Jul 2, 2019
- Analog Devices Global
- Edward John Coyne
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE CONFIGURED FOR GATE DIELECTRIC MONITORING
- Publication number 20250004034
- Publication date Jan 2, 2025
- Analog Devices International Unlimited Company
- Edward John Coyne
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WEAR-OUT MONITOR DEVICE
- Publication number 20210088580
- Publication date Mar 25, 2021
- ANALOG DEVICES GLOBAL
- Edward John Coyne
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE CONFIGURED FOR GATE DIELECTRIC MONITORING
- Publication number 20210072304
- Publication date Mar 11, 2021
- Analog Devices International Unlimited Company
- Edward John Coyne
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WEAR-OUT MONITOR DEVICE
- Publication number 20190361071
- Publication date Nov 28, 2019
- ANALOG DEVICES GLOBAL
- Edward John Coyne
- G01 - MEASURING TESTING
Information Patent Application
WEAR-OUT MONITOR DEVICE
- Publication number 20170299649
- Publication date Oct 19, 2017
- ANALOG DEVICES GLOBAL
- Edward John Coyne
- G01 - MEASURING TESTING
Information Patent Application
WEAR-OUT MONITOR DEVICE
- Publication number 20170299650
- Publication date Oct 19, 2017
- ANALOG DEVICES GLOBAL
- Edward John Coyne
- G01 - MEASURING TESTING