Membership
Tour
Register
Log in
Colm Patrick Heffernan
Follow
Person
Annacotty, IE
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Semiconductor device configured for gate dielectric monitoring
Patent number
12,032,014
Issue date
Jul 9, 2024
Analog Devices International Unlimited Company
Edward John Coyne
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Wear-out monitor device
Patent number
10,794,950
Issue date
Oct 6, 2020
Analog Devices Global
Edward John Coyne
G01 - MEASURING TESTING
Information
Patent Grant
Wear-out monitor device
Patent number
10,365,322
Issue date
Jul 30, 2019
Analog Devices Global
Edward John Coyne
G01 - MEASURING TESTING
Information
Patent Grant
Wear-out monitor device
Patent number
10,338,132
Issue date
Jul 2, 2019
Analog Devices Global
Edward John Coyne
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
SEMICONDUCTOR DEVICE CONFIGURED FOR GATE DIELECTRIC MONITORING
Publication number
20250004034
Publication date
Jan 2, 2025
Analog Devices International Unlimited Company
Edward John Coyne
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
WEAR-OUT MONITOR DEVICE
Publication number
20210088580
Publication date
Mar 25, 2021
ANALOG DEVICES GLOBAL
Edward John Coyne
G01 - MEASURING TESTING
Information
Patent Application
SEMICONDUCTOR DEVICE CONFIGURED FOR GATE DIELECTRIC MONITORING
Publication number
20210072304
Publication date
Mar 11, 2021
Analog Devices International Unlimited Company
Edward John Coyne
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
WEAR-OUT MONITOR DEVICE
Publication number
20190361071
Publication date
Nov 28, 2019
ANALOG DEVICES GLOBAL
Edward John Coyne
G01 - MEASURING TESTING
Information
Patent Application
WEAR-OUT MONITOR DEVICE
Publication number
20170299649
Publication date
Oct 19, 2017
ANALOG DEVICES GLOBAL
Edward John Coyne
G01 - MEASURING TESTING
Information
Patent Application
WEAR-OUT MONITOR DEVICE
Publication number
20170299650
Publication date
Oct 19, 2017
ANALOG DEVICES GLOBAL
Edward John Coyne
G01 - MEASURING TESTING