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Conrad Mukai
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San Jose, CA, US
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last 30 patents
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Patent Grant
Method and system for simulating a modular test system
Patent number
7,210,087
Issue date
Apr 24, 2007
Advantest America R&D Center, Inc.
Conrad Mukai
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
Method and system for simulating a modular test system
Publication number
20050262412
Publication date
Nov 24, 2005
Advantest America R&D Center, Inc.
Conrad Mukai
G01 - MEASURING TESTING