Cornel BOZDOG

Person

Boise, ID, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method and system for non-destructive metrology of thin layers
- Patent number 12,066,391
- Issue date Aug 20, 2024
- NOVA MEASURING INSTRUMENTS, INC.
- Wei Ti Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for non-destructive metrology of thin layers
- Patent number 11,906,451
- Issue date Feb 20, 2024
- Nova Ltd.
- Wei Ti Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for optical characterization of patterned samples
- Patent number 11,885,737
- Issue date Jan 30, 2024
- Nova Ltd.
- Dror Shafir
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for non-destructive metrology of thin layers
- Patent number 11,668,663
- Issue date Jun 6, 2023
- NOVA MEASURING INSTRUMENTS, INC.
- Wei Ti Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for optical characterization of patterned samples
- Patent number 10,876,959
- Issue date Dec 29, 2020
- Nova Measuring Instruments Ltd.
- Dror Shafir
- G01 - MEASURING TESTING
Information Patent Grant
Method for use in process control of manufacture of patterned sample
- Patent number 10,534,275
- Issue date Jan 14, 2020
- Nova Measuring Instruments Ltd.
- Cornel Bozdog
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for non-destructive metrology of thin layers
- Patent number 10,533,961
- Issue date Jan 14, 2020
- NOVA MEASURING INSTRUMENTS, INC.
- Wei Ti Lee
- G01 - MEASURING TESTING
Information Patent Grant
Scatterometry method and system
- Patent number 10,302,414
- Issue date May 28, 2019
- Nova Measuring Instruments Ltd.
- Gilad Wainreb
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for determining strain distribution in a sample
- Patent number 10,209,206
- Issue date Feb 19, 2019
- Nova Measuring Instruments Ltd.
- Gilad Barak
- G01 - MEASURING TESTING
Information Patent Grant
Optical metrology for in-situ measurements
- Patent number 10,197,506
- Issue date Feb 5, 2019
- Nova Measuring Instruments Ltd.
- Igor Turovets
- G01 - MEASURING TESTING
Information Patent Grant
Measurement system and method for measuring in thin films
- Patent number 10,030,971
- Issue date Jul 24, 2018
- Globalfoundries, Inc.
- Cornel Bozdog
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optical metrology for in-situ measurements
- Patent number 9,915,624
- Issue date Mar 13, 2018
- Nova Measuring Instruments, Ltd.
- Igor Turovets
- G01 - MEASURING TESTING
Information Patent Grant
Optical metrology for in-situ measurements
- Patent number 9,528,946
- Issue date Dec 27, 2016
- Nova Measuring Instruments Ltd.
- Igor Turovets
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND SYSTEM FOR NON-DESTRUCTIVE METROLOGY OF THIN LAYERS
- Publication number 20250052704
- Publication date Feb 13, 2025
- NOVA MEASURING INSTRUMENTS INC.
- Wei Ti LEE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM FOR OPTICAL CHARACTERIZATION OF PATTERNED SAMPLES
- Publication number 20240337590
- Publication date Oct 10, 2024
- NOVA LTD
- Dror SHAFIR
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR NON-DESTRUCTIVE METROLOGY OF THIN LAYERS
- Publication number 20230408430
- Publication date Dec 21, 2023
- NOVA MEASURING INSTRUMENTS, INC.
- Wei Ti Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM FOR NON-DESTRUCTIVE METROLOGY OF THIN LAYERS
- Publication number 20220074878
- Publication date Mar 10, 2022
- NOVA LTD
- Wei Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM FOR OPTICAL CHARACTERIZATION OF PATTERNED SAMPLES
- Publication number 20210116359
- Publication date Apr 22, 2021
- NOVA MEASURING INSTRUMENTS LTD.
- Dror SHAFIR
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR NON-DESTRUCTIVE METROLOGY OF THIN LAYERS
- Publication number 20200191734
- Publication date Jun 18, 2020
- Nova Measuring Instruments, Inc.
- Wei Ti Lee
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR OPTICAL CHARACTERIZATION OF PATTERNED SAMPLES
- Publication number 20180328837
- Publication date Nov 15, 2018
- NOVA MEASURING INSTRUMENTS LTD.
- Dror SHAFIR
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR NON-DESTRUCTIVE METROLOGY OF THIN LAYERS
- Publication number 20180328871
- Publication date Nov 15, 2018
- Nova Measuring Instruments, Inc.
- Wei Ti Lee
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL METROLOGY FOR IN-SITU MEASUREMENTS
- Publication number 20180195975
- Publication date Jul 12, 2018
- NOVA MEASURING INSTRUMENTS LTD.
- Igor Turovets
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR USE IN PROCESS CONTROL OF MANUFACTURE OF PATTERNED SAMPLE
- Publication number 20180196356
- Publication date Jul 12, 2018
- NOVA MEASURING INSTRUMENTS LTD.
- Cornel BOZDOG
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD AND SYSTEM FOR NON-DESTRUCTIVE METROLOGY OF THIN LAYERS
- Publication number 20180172609
- Publication date Jun 21, 2018
- NOVA MEASURING INSTRUMENTS LTD.
- Wei Ti LEE
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL METROLOGY FOR IN-SITU MEASUREMENTS
- Publication number 20170167987
- Publication date Jun 15, 2017
- NOVA MEASURING INSTRUMENTS LTD.
- Igor Turovets
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT SYSTEM AND METHOD FOR MEASURING IN THIN FILMS
- Publication number 20170038201
- Publication date Feb 9, 2017
- GLOBALFOUNDRIES, INC.
- Cornel Bozdog
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR DETERMINING STRAIN DISTRIBUTION IN A SAMPLE
- Publication number 20160139065
- Publication date May 19, 2016
- NOVA MEASURING INSTRUMENTS LTD.
- Gilad BARAK
- G01 - MEASURING TESTING
Information Patent Application
SCATTEROMETRY METHOD AND SYSTEM
- Publication number 20160076876
- Publication date Mar 17, 2016
- NOVA MEASURING INSTRUMENTS LTD.
- Gilad WAINREB
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR OPTICAL CHARACTERIZATION OF PATTERNED SAMPLES
- Publication number 20150316468
- Publication date Nov 5, 2015
- NOVA MEASURING INSTRUMENTS LTD.
- Dror SHAFIR
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL METROLOGY FOR IN-SITU MEASUREMENTS
- Publication number 20150226680
- Publication date Aug 13, 2015
- NOVA MEASURING INSTRUMENTS LTD.
- Igor Turovets
- G01 - MEASURING TESTING

Cornel BOZDOG

Person

Patents Grantslast 30 patents

Method and system for non-destructive metrology of thin layers

Method and system for non-destructive metrology of thin layers

Method and system for optical characterization of patterned samples

Method and system for non-destructive metrology of thin layers

Method and system for optical characterization of patterned samples

Method for use in process control of manufacture of patterned sample

Method and system for non-destructive metrology of thin layers

Scatterometry method and system

Method and system for determining strain distribution in a sample

Optical metrology for in-situ measurements

Measurement system and method for measuring in thin films

Optical metrology for in-situ measurements

Optical metrology for in-situ measurements

Patents Applicationslast 30 patents

METHOD AND SYSTEM FOR NON-DESTRUCTIVE METROLOGY OF THIN LAYERS

METHOD AND SYSTEM FOR OPTICAL CHARACTERIZATION OF PATTERNED SAMPLES

METHOD AND SYSTEM FOR NON-DESTRUCTIVE METROLOGY OF THIN LAYERS

METHOD AND SYSTEM FOR NON-DESTRUCTIVE METROLOGY OF THIN LAYERS

METHOD AND SYSTEM FOR OPTICAL CHARACTERIZATION OF PATTERNED SAMPLES

METHOD AND SYSTEM FOR NON-DESTRUCTIVE METROLOGY OF THIN LAYERS

METHOD AND SYSTEM FOR OPTICAL CHARACTERIZATION OF PATTERNED SAMPLES

METHOD AND SYSTEM FOR NON-DESTRUCTIVE METROLOGY OF THIN LAYERS

OPTICAL METROLOGY FOR IN-SITU MEASUREMENTS

METHOD FOR USE IN PROCESS CONTROL OF MANUFACTURE OF PATTERNED SAMPLE

METHOD AND SYSTEM FOR NON-DESTRUCTIVE METROLOGY OF THIN LAYERS

OPTICAL METROLOGY FOR IN-SITU MEASUREMENTS

MEASUREMENT SYSTEM AND METHOD FOR MEASURING IN THIN FILMS

METHOD AND SYSTEM FOR DETERMINING STRAIN DISTRIBUTION IN A SAMPLE

SCATTEROMETRY METHOD AND SYSTEM

METHOD AND SYSTEM FOR OPTICAL CHARACTERIZATION OF PATTERNED SAMPLES

OPTICAL METROLOGY FOR IN-SITU MEASUREMENTS