Cornelis G. Van Beek

Person

Pittsburgh, PA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Methods and systems for inclusion analysis
- Patent number 11,921,053
- Issue date Mar 5, 2024
- FEI Company
- Jean-Marc Bohlen
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for inclusion analysis
- Patent number 11,150,197
- Issue date Oct 19, 2021
- FEI Company
- Jean-Marc Bohlen
- G01 - MEASURING TESTING
Information Patent Grant
Electron microscope with multiple types of integrated x-ray detecto...
- Patent number 9,972,474
- Issue date May 15, 2018
- FEI Company
- Cornelis van Beek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope with integrated detector(s)
- Patent number 8,987,665
- Issue date Mar 24, 2015
- FEI Company
- Frederick H. Schamber
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for correlating an optical image and a SEM image and meth...
- Patent number RE44035
- Issue date Mar 5, 2013
- FEI Company
- Frederick H. Schamber
- 250 - Radiant energy
Information Patent Grant
Electron microscope with integrated detector(s)
- Patent number 8,334,511
- Issue date Dec 18, 2012
- FEI Company
- Frederick H. Schamber
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle detection auditing system and method
- Patent number 7,476,858
- Issue date Jan 13, 2009
- Aspex Corporation
- Frederick H. Schamber
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for correlating an optical image and a SEM image and meth...
- Patent number 6,683,316
- Issue date Jan 27, 2004
- Aspex, LLC
- Frederick Schamber
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHODS AND SYSTEMS FOR INCLUSION ANALYSIS
- Publication number 20220026373
- Publication date Jan 27, 2022
- FEI Company
- Jean-Marc Bohlen
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR INCLUSION ANALYSIS
- Publication number 20200309715
- Publication date Oct 1, 2020
- FEI Company
- Jean-Marc Bohlen
- G01 - MEASURING TESTING
Information Patent Application
ELECTRON MICROSCOPE WITH MULTIPE TYPES OF INTEGRATED X-RAY DETECTOR...
- Publication number 20180033589
- Publication date Feb 1, 2018
- FEI Company
- Frederick H. Schamber
- G01 - MEASURING TESTING
Information Patent Application
Electron Microscope with Integrated Detector(s)
- Publication number 20130299698
- Publication date Nov 14, 2013
- Frederick H. Schamber
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON MICROCOPE WHITH INTEGRATED DETECTOR(S)
- Publication number 20110204229
- Publication date Aug 25, 2011
- Frederick H Schamber
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Particle detection auditing system and method
- Publication number 20070114407
- Publication date May 24, 2007
- Aspex Corporation
- Frederick H. Schamber
- G01 - MEASURING TESTING

Cornelis G. Van Beek

Person

Patents Grantslast 30 patents

Methods and systems for inclusion analysis

Methods and systems for inclusion analysis

Electron microscope with multiple types of integrated x-ray detecto...

Electron microscope with integrated detector(s)

Apparatus for correlating an optical image and a SEM image and meth...

Electron microscope with integrated detector(s)

Particle detection auditing system and method

Apparatus for correlating an optical image and a SEM image and meth...

Patents Applicationslast 30 patents

METHODS AND SYSTEMS FOR INCLUSION ANALYSIS

METHODS AND SYSTEMS FOR INCLUSION ANALYSIS

ELECTRON MICROSCOPE WITH MULTIPE TYPES OF INTEGRATED X-RAY DETECTOR...

Electron Microscope with Integrated Detector(s)

ELECTRON MICROCOPE WHITH INTEGRATED DETECTOR(S)

Particle detection auditing system and method