Cornelis Johannes Henricus LAMBREGTS

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Geldrop, NL

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Patents Grantslast 30 patents

Information Patent Grant
Device manufacturing method
- Patent number 11,709,434
- Issue date Jul 25, 2023
- ASML Netherlands B.V.
- Rizvi Rahman
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Computational metrology based correction and control
- Patent number 11,448,973
- Issue date Sep 20, 2022
- ASML Netherlands B.V.
- Manouk Rijpstra
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method for evaluating control strategies in a semiconductor manufac...
- Patent number 11,372,338
- Issue date Jun 28, 2022
- ASML Netherlands B.V.
- Ivo Matteo Leonardus Weijden
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
COMPUTATIONAL METROLOGY BASED CORRECTION AND CONTROL
- Publication number 20220365446
- Publication date Nov 17, 2022
- ASML NETHERLANDS B.V.
- Manouk RIJPSTRA
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
DEVICE MANUFACTURING METHOD
- Publication number 20220276570
- Publication date Sep 1, 2022
- ASML NETHERLANDS B.V.
- Rizvi RAHMAN
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD FOR CONTROLLING A SEMICONDUCTOR MANUFACTURING PROCESS
- Publication number 20220236647
- Publication date Jul 28, 2022
- ASML NETHERLANDS B.V.
- Marc HAUPTMANN
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
COMPUTATIONAL METROLOGY BASED CORRECTION AND CONTROL
- Publication number 20210080837
- Publication date Mar 18, 2021
- ASML NETHERLANDS B.V.
- Manouk RIJPSTRA
- G05 - CONTROLLING REGULATING
Information Patent Application
METHOD FOR EVALUATING CONTROL STRATEGIES IN A SEMICONDUCTOR MANUFAC...
- Publication number 20200401052
- Publication date Dec 24, 2020
- ASML NETHERLANDS B.V.
- Ivo Matteo Leonardus WEIJDEN
- G01 - MEASURING TESTING