Cornelis Sander Kooijman

Person

Veldhoven, NL

People

Patents Grantslast 30 patents

Information Patent Grant
Composite scan path in a charged particle microscope
- Patent number 10,002,742
- Issue date Jun 19, 2018
- FEI Company
- Pavel Potocek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
User interface for an electron microscope
- Patent number 9,865,427
- Issue date Jan 9, 2018
- FEI Company
- Martinus Petrus Maria Bierhoff
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mathematical image assembly in a scanning-type microscope
- Patent number 9,620,330
- Issue date Apr 11, 2017
- FEI Company
- Pavel Potocek
- G02 - OPTICS
Information Patent Grant
Adaptive scanning for particle size using directed beam signal anal...
- Patent number 9,502,211
- Issue date Nov 22, 2016
- FEI Company
- Cornelis Sander Kooijman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for analyzing an EDS signal
- Patent number 9,361,275
- Issue date Jun 7, 2016
- FEI Company
- Cornelis Sander Kooijman
- G01 - MEASURING TESTING
Information Patent Grant
User interface for an electron microscope
- Patent number 9,025,018
- Issue date May 5, 2015
- FEI Company
- Martinus Petrus Maria Bierhoff
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Silicon drift diode detector configured to switch between pulse hei...
- Patent number 8,941,072
- Issue date Jan 27, 2015
- FEI Company
- Cornelis Sander Kooijman
- G01 - MEASURING TESTING
Information Patent Grant
Clustering of multi-modal data
- Patent number 8,748,816
- Issue date Jun 10, 2014
- FEI Company
- Cornelis Sander Kooijman
- G01 - MEASURING TESTING
Information Patent Grant
Scanning method for scanning a sample with a probe
- Patent number 8,707,461
- Issue date Apr 22, 2014
- FEI Company
- Arthur Reinout Hartong
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Pattern modification schemes for improved FIB patterning
- Patent number 8,624,206
- Issue date Jan 7, 2014
- FEI Company
- Tom Miller
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged-particle microscope providing depth-resolved imagery
- Patent number 8,586,921
- Issue date Nov 19, 2013
- FEI Company
- Faysal Boughorbel
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle microscopy imaging method
- Patent number 8,581,189
- Issue date Nov 12, 2013
- FEI Company
- Faysal Boughorbel
- G01 - MEASURING TESTING
Information Patent Grant
Radiation detector
- Patent number 8,450,820
- Issue date May 28, 2013
- Lis Karen Nanver
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Hermetically sealed housing with electrical feed-in
- Patent number 8,354,587
- Issue date Jan 15, 2013
- FEI Company
- Hendrik Gezinus Tappel
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Detector system for use with transmission electron microscope spect...
- Patent number 8,334,512
- Issue date Dec 18, 2012
- FEI Company
- Uwe Luecken
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Pattern modification schemes for improved FIB patterning
- Patent number 8,314,409
- Issue date Nov 20, 2012
- FEI Company
- Tom Miller
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Compact scanning electron microscope
- Patent number 8,309,921
- Issue date Nov 13, 2012
- FEI Company
- Martinus Petrus Maria Bierhoff
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dark field detector for use in an electron microscope
- Patent number 8,288,724
- Issue date Oct 16, 2012
- FEI Company
- Cornelis Sander Kooijman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
SEM imaging method
- Patent number 8,232,523
- Issue date Jul 31, 2012
- FEI Company
- Faysal Boughorbel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Compact scanning electron microscope
- Patent number 7,906,762
- Issue date Mar 15, 2011
- FEI Company
- Mart Petrus Maria Bierhoff
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Magnetic lens
- Patent number 6,852,982
- Issue date Feb 8, 2005
- FEI Company
- Martinus Petrus Maria Bierhoff
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
PULSE PROCESSING
- Publication number 20190362932
- Publication date Nov 28, 2019
- FEI Company
- Nikolaos Kontaras
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ADAPTIVE SCANNING FOR PARTICLE SIZE USING DIRECTED BEAM SIGNAL ANAL...
- Publication number 20160322194
- Publication date Nov 3, 2016
- FEI Company
- Cornelis Sander Kooijman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PULSE PROCESSING
- Publication number 20160254119
- Publication date Sep 1, 2016
- FEI Company
- Nikolaos Kontaras
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE MICROSCOPE WITH IMPROVED SPECTROSCOPIC FUNCTIONALITY
- Publication number 20160189922
- Publication date Jun 30, 2016
- FEI Company
- Cornelis Sander Kooijman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COMPOSITE SCAN PATH IN A CHARGED PARTICLE MICROSCOPE
- Publication number 20160118219
- Publication date Apr 28, 2016
- FEI Company
- Pavel Potocek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Radiation Sensor, and its Application in a Charged-Particle Microscope
- Publication number 20160056015
- Publication date Feb 25, 2016
- FEI Company
- Gerard Nicolaas Anne van Veen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MATHEMATICAL IMAGE ASSEMBLY IN A SCANNING-TYPE MICROSCOPE
- Publication number 20150371815
- Publication date Dec 24, 2015
- FEI Company
- Pavel Potocek
- G02 - OPTICS
Information Patent Application
USER INTERFACE FOR AN ELECTRON MICROSCOPE
- Publication number 20150332891
- Publication date Nov 19, 2015
- FEI Company
- MART PETRUS MARIA BIERHOFF
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Imaging a Sample with Multiple Beams and Multiple Detectors
- Publication number 20150279615
- Publication date Oct 1, 2015
- FEI Company
- Pavel Potocek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for Analyzing an EDS Signal
- Publication number 20130277555
- Publication date Oct 24, 2013
- FEI Company
- Cornelis Sander Kooijman
- G01 - MEASURING TESTING
Information Patent Application
Scanning Method for Scanning a Sample with a Probe
- Publication number 20130254948
- Publication date Sep 26, 2013
- Arthur Reinout Hartong
- B82 - NANO-TECHNOLOGY
Information Patent Application
DETECTOR FOR USE IN A CHARGED PARTICLE APPARATUS
- Publication number 20130099114
- Publication date Apr 25, 2013
- FEI Company
- Cornelis Sander Kooijman
- G01 - MEASURING TESTING
Information Patent Application
Pattern Modification Schemes for Improved FIB Patterning
- Publication number 20130092826
- Publication date Apr 18, 2013
- FEI Company
- Tom Miller
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED-PARTICLE MICROSCOPE PROVIDING DEPTH-RESOLVED IMAGERY
- Publication number 20130037715
- Publication date Feb 14, 2013
- FEI Company
- Faysal Boughorbel
- G01 - MEASURING TESTING
Information Patent Application
Charged-Particle Microscopy Imaging Method
- Publication number 20130037714
- Publication date Feb 14, 2013
- FEI Company
- Faysal Boughorbel
- G01 - MEASURING TESTING
Information Patent Application
CLUSTERING OF MULTI-MODAL DATA
- Publication number 20130015351
- Publication date Jan 17, 2013
- FEI Company
- Cornelis Sander Kooijman
- G01 - MEASURING TESTING
Information Patent Application
Detector System for Use with Transmission Electron Microscope Spect...
- Publication number 20120049060
- Publication date Mar 1, 2012
- FEI Company
- Uwe Luecken
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEM Imaging Method
- Publication number 20110266440
- Publication date Nov 3, 2011
- FEI Company
- Faysal Boughorbel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Radiation Detector
- Publication number 20110169116
- Publication date Jul 14, 2011
- FEI Company
- Lis Karen Nanver
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COMPACT SCANNING ELECTRON MICROSCOPE
- Publication number 20110133083
- Publication date Jun 9, 2011
- FEI Company
- MART PETRUS MARIA BIERHOFF
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PATTERN MODIFICATION SCHEMES FOR IMPROVED FIB PATTERNING
- Publication number 20110049382
- Publication date Mar 3, 2011
- FEI Company
- Tom Miller
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DARK FIELD DETECTOR FOR USE IN AN ELECTRON MICROSCOPE
- Publication number 20100258721
- Publication date Oct 14, 2010
- FEI Company
- CORNELIS SANDER KOOIJMAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Compact Scanning Electron Microscope
- Publication number 20100230590
- Publication date Sep 16, 2010
- FEI Company
- Mart Petrus Maria Bierhoff
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COMPACT SCANNING ELECTRON MICROSCOPE
- Publication number 20100171037
- Publication date Jul 8, 2010
- FEI Company
- Mart Petrus Maria Bierhoff
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HERMETICALLY SEALED HOUSING WITH ELECTRICAL FEED-IN
- Publication number 20090200489
- Publication date Aug 13, 2009
- FEI Company
- Hendrik Gezinus Tappel
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
MAGNETIC LENS
- Publication number 20050012049
- Publication date Jan 20, 2005
- Martinus Petrus Maria Bierhoff
- H01 - BASIC ELECTRIC ELEMENTS

Cornelis Sander Kooijman

Person

Patents Grantslast 30 patents

Composite scan path in a charged particle microscope

User interface for an electron microscope

Mathematical image assembly in a scanning-type microscope

Adaptive scanning for particle size using directed beam signal anal...

Method for analyzing an EDS signal

User interface for an electron microscope

Silicon drift diode detector configured to switch between pulse hei...

Clustering of multi-modal data

Scanning method for scanning a sample with a probe

Pattern modification schemes for improved FIB patterning

Charged-particle microscope providing depth-resolved imagery

Charged particle microscopy imaging method

Radiation detector

Hermetically sealed housing with electrical feed-in

Detector system for use with transmission electron microscope spect...

Pattern modification schemes for improved FIB patterning

Compact scanning electron microscope

Dark field detector for use in an electron microscope

SEM imaging method

Compact scanning electron microscope

Magnetic lens

Patents Applicationslast 30 patents

PULSE PROCESSING

ADAPTIVE SCANNING FOR PARTICLE SIZE USING DIRECTED BEAM SIGNAL ANAL...

PULSE PROCESSING

CHARGED PARTICLE MICROSCOPE WITH IMPROVED SPECTROSCOPIC FUNCTIONALITY

COMPOSITE SCAN PATH IN A CHARGED PARTICLE MICROSCOPE

Radiation Sensor, and its Application in a Charged-Particle Microscope

MATHEMATICAL IMAGE ASSEMBLY IN A SCANNING-TYPE MICROSCOPE

USER INTERFACE FOR AN ELECTRON MICROSCOPE

Imaging a Sample with Multiple Beams and Multiple Detectors

Method for Analyzing an EDS Signal

Scanning Method for Scanning a Sample with a Probe

DETECTOR FOR USE IN A CHARGED PARTICLE APPARATUS

Pattern Modification Schemes for Improved FIB Patterning

CHARGED-PARTICLE MICROSCOPE PROVIDING DEPTH-RESOLVED IMAGERY

Charged-Particle Microscopy Imaging Method

CLUSTERING OF MULTI-MODAL DATA

Detector System for Use with Transmission Electron Microscope Spect...

SEM Imaging Method

Radiation Detector

COMPACT SCANNING ELECTRON MICROSCOPE

PATTERN MODIFICATION SCHEMES FOR IMPROVED FIB PATTERNING

DARK FIELD DETECTOR FOR USE IN AN ELECTRON MICROSCOPE

Compact Scanning Electron Microscope

COMPACT SCANNING ELECTRON MICROSCOPE

HERMETICALLY SEALED HOUSING WITH ELECTRICAL FEED-IN

MAGNETIC LENS