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Cornell Gonschior
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Friedberg, DE
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Patents Grants
last 30 patents
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Patent Grant
Optical scanning microscope and examination method
Patent number
11,630,292
Issue date
Apr 18, 2023
Leica Microsystems CMS GmbH
Christian Schumann
G02 - OPTICS
Information
Patent Grant
Microscope having a correction unit for correcting a variable spher...
Patent number
10,133,063
Issue date
Nov 20, 2018
Leica Microsystems CMS GmbH
Christian Schulz
G02 - OPTICS
Patents Applications
last 30 patents
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Patent Application
OPTICAL SCANNING MICROSCOPE AND EXAMINATION METHOD
Publication number
20200319445
Publication date
Oct 8, 2020
Leica Microsystems CMS GmbH
Christian Schumann
G02 - OPTICS
Information
Patent Application
MICROSCOPE ILLUMINATION DEVICE AND MICROSCOPE HAVING SUCH A MICROSC...
Publication number
20190258044
Publication date
Aug 22, 2019
Leica Microsystems CMS GmbH
Cornell Peter Gonschior
G02 - OPTICS
Information
Patent Application
MICROSCOPE HAVING A CORRECTION UNIT FOR CORRECTING A VARIABLE SPHER...
Publication number
20170192227
Publication date
Jul 6, 2017
Leica Microsystems CMS GmbH
Christian Schulz
G02 - OPTICS