Cory Watkins

Person

Eden Prairie, MN, US

People

Patents Grantslast 30 patents

Information Patent Grant
Automated wafer defect inspection system and a process of performin...
- Patent number 9,464,992
- Issue date Oct 11, 2016
- Rudolph Technologies, Inc.
- Jeffrey L. O'Dell
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Automated wafer defect inspection system and a process of performin...
- Patent number 9,337,071
- Issue date May 10, 2016
- Rudolph Technologies, Inc.
- Jeffrey L. O'Dell
- G01 - MEASURING TESTING
Information Patent Grant
Wafer holding mechanism
- Patent number 8,130,372
- Issue date Mar 6, 2012
- Rudolph Technologies, Inc.
- Mark Harless
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Product setup sharing for multiple inspection systems
- Patent number 8,045,788
- Issue date Oct 25, 2011
- August Technology Corp.
- Cory Watkins
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Edge inspection
- Patent number 7,822,260
- Issue date Oct 26, 2010
- Rudolph Technologies, Inc.
- Cory Watkins
- G01 - MEASURING TESTING
Information Patent Grant
System for generating camera triggers
- Patent number 7,813,638
- Issue date Oct 12, 2010
- Rudolph Technologies, Inc.
- Cory Watkins
- G01 - MEASURING TESTING
Information Patent Grant
Automated wafer defect inspection system and a process of performin...
- Patent number 7,729,528
- Issue date Jun 1, 2010
- Rudolph Technologies, Inc.
- Jeffrey O'Dell
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Wafer holding mechanism
- Patent number 7,703,823
- Issue date Apr 27, 2010
- Rudolph Technologies, Inc.
- Mark Harless
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Camera and illumination matching for inspection system
- Patent number 7,589,783
- Issue date Sep 15, 2009
- Rudolph Technologies, Inc.
- Patrick Simpkins
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Edge inspection
- Patent number 7,340,087
- Issue date Mar 4, 2008
- Rudolph Technologies, Inc.
- Cory Watkins
- G01 - MEASURING TESTING
Information Patent Grant
Dynamic focusing method and apparatus
- Patent number 7,321,108
- Issue date Jan 22, 2008
- Rudolph Technology, Inc.
- Cory Watkins
- G01 - MEASURING TESTING
Information Patent Grant
Dynamic focusing method and apparatus
- Patent number 7,196,300
- Issue date Mar 27, 2007
- Rudolph Technologies, Inc.
- Cory Watkins
- G01 - MEASURING TESTING
Information Patent Grant
Data transfer device with data frame grabber with switched fabric i...
- Patent number 7,111,095
- Issue date Sep 19, 2006
- August Technology Corp.
- Cory M. Watkins
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Confocal 3D inspection system and process
- Patent number 6,970,287
- Issue date Nov 29, 2005
- August Technology Corp.
- Cory Watkins
- G01 - MEASURING TESTING
Information Patent Grant
Confocal 3D inspection system and process
- Patent number 6,882,415
- Issue date Apr 19, 2005
- August Technology Corp.
- Cory Watkins
- G01 - MEASURING TESTING
Information Patent Grant
Confocal 3D inspection system and process
- Patent number 6,870,609
- Issue date Mar 22, 2005
- August Technology Corp.
- Cory Watkins
- G01 - MEASURING TESTING
Information Patent Grant
Automated wafer defect inspection system and a process of performin...
- Patent number 6,826,298
- Issue date Nov 30, 2004
- August Technology Corp.
- Jeffrey O'Dell
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Confocal 3D inspection system and process
- Patent number 6,773,935
- Issue date Aug 10, 2004
- August Technology Corp.
- Cory Watkins
- G01 - MEASURING TESTING
Information Patent Grant
Confocal 3D inspection system and process
- Patent number 6,731,383
- Issue date May 4, 2004
- August Technology Corp.
- Cory Watkins
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Automated Wafer Defect Inspection System and a Process of Performin...
- Publication number 20160223470
- Publication date Aug 4, 2016
- Rudolph Technologies, Inc.
- Jeffrey L. O'Dell
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED WAFER DEFECT INSPECTION SYSTEM AND A PROCESS OF PERFORMIN...
- Publication number 20120087569
- Publication date Apr 12, 2012
- Rudolph Technologies, Inc.
- Jeffrey O'Dell
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
AUTOMATED WAFER DEFECT INSPECTION SYSTEM AND A PROCESS OF PERFORMIN...
- Publication number 20100239157
- Publication date Sep 23, 2010
- Rudolph Technologies, Inc.
- Jeffrey O'Dell
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
WAFER HOLDING MECHANISM
- Publication number 20100166292
- Publication date Jul 1, 2010
- Mark Harless
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WAFER BEVEL INSPECTION MECHANISM
- Publication number 20090161094
- Publication date Jun 25, 2009
- Cory M. Watkins
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
EDGE INSPECTION
- Publication number 20080212084
- Publication date Sep 4, 2008
- Cory Watkins
- G01 - MEASURING TESTING
Information Patent Application
COLOR IMAGING USING MONOCHROME IMAGERS
- Publication number 20070158535
- Publication date Jul 12, 2007
- Cory Watkins
- G01 - MEASURING TESTING
Information Patent Application
DYNAMIC FOCUSING METHOD AND APPARTUS
- Publication number 20070114358
- Publication date May 24, 2007
- Cory Watkins
- G02 - OPTICS
Information Patent Application
Wafer holding mechanism
- Publication number 20060046396
- Publication date Mar 2, 2006
- Mark Harless
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Dynamic focusing method and apparatus
- Publication number 20060033056
- Publication date Feb 16, 2006
- Cory Watkins
- G02 - OPTICS
Information Patent Application
Camera module for an optical inspection system and related method o...
- Publication number 20060023229
- Publication date Feb 2, 2006
- Cory Watkins
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
System for generating camera triggers
- Publication number 20050276595
- Publication date Dec 15, 2005
- August Technology Corp.
- Cory Watkins
- G01 - MEASURING TESTING
Information Patent Application
Multi-tool manager
- Publication number 20050052197
- Publication date Mar 10, 2005
- Cory Watkins
- G05 - CONTROLLING REGULATING
Information Patent Application
Camera and illumination matching for inspection system
- Publication number 20050052530
- Publication date Mar 10, 2005
- Patrick Simpkins
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Product setup sharing for multiple inspection systems
- Publication number 20050041850
- Publication date Feb 24, 2005
- Cory Watkins
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Inspection and metrology module cluster tool
- Publication number 20050038554
- Publication date Feb 17, 2005
- Cory Watkins
- G05 - CONTROLLING REGULATING
Information Patent Application
Edge inspection
- Publication number 20050036671
- Publication date Feb 17, 2005
- Cory Watkins
- G01 - MEASURING TESTING
Information Patent Application
Automated wafer defect inspection system and a process of performin...
- Publication number 20050008218
- Publication date Jan 13, 2005
- Jeffrey O'Dell
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Imaging system using theta-theta coordinate stage and continuous im...
- Publication number 20040179096
- Publication date Sep 16, 2004
- August Technology Corp.
- Mark R. Harless
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Inspection tool with partial framing camrea
- Publication number 20040109600
- Publication date Jun 10, 2004
- Cory Watkins
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Confocal 3D inspection system and process
- Publication number 20040102043
- Publication date May 27, 2004
- August Technology Corp.
- Cory Watkins
- G02 - OPTICS
Information Patent Application
Inspection tool with partial framing/windowing camera
- Publication number 20040096095
- Publication date May 20, 2004
- August Technology Corp.
- Cory Watkins
- G01 - MEASURING TESTING
Information Patent Application
Switched fabric based inspection system
- Publication number 20030220997
- Publication date Nov 27, 2003
- August Technology Corp.
- Cory M. Watkins
- G01 - MEASURING TESTING
Information Patent Application
Data grabber with switched fabric interface
- Publication number 20030221042
- Publication date Nov 27, 2003
- August Technology Corp.
- Cory M. Watkins
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Sensor with switched fabric interface
- Publication number 20030221041
- Publication date Nov 27, 2003
- August Technology Corp.
- Cory M. Watkins
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Confocal 3D inspection system and process
- Publication number 20030052346
- Publication date Mar 20, 2003
- Cory Watkins
- G01 - MEASURING TESTING
Information Patent Application
Confocal 3D inspection system and process
- Publication number 20030030794
- Publication date Feb 13, 2003
- August Technology Corp.
- Cory Watkins
- G01 - MEASURING TESTING
Information Patent Application
Confocal 3D inspection system and process
- Publication number 20030027367
- Publication date Feb 6, 2003
- August Technology Corp.
- Cory Watkins
- G01 - MEASURING TESTING
Information Patent Application
Confocal 3D inspection system and process
- Publication number 20030025918
- Publication date Feb 6, 2003
- August Technology Corp.
- Cory Watkins
- G01 - MEASURING TESTING
Information Patent Application
Confocal 3D inspection system and process
- Publication number 20020191178
- Publication date Dec 19, 2002
- Cory Watkins
- G01 - MEASURING TESTING

Cory Watkins

Person

Patents Grantslast 30 patents

Automated wafer defect inspection system and a process of performin...

Automated wafer defect inspection system and a process of performin...

Wafer holding mechanism

Product setup sharing for multiple inspection systems

Edge inspection

System for generating camera triggers

Automated wafer defect inspection system and a process of performin...

Wafer holding mechanism

Camera and illumination matching for inspection system

Edge inspection

Dynamic focusing method and apparatus

Dynamic focusing method and apparatus

Data transfer device with data frame grabber with switched fabric i...

Confocal 3D inspection system and process

Confocal 3D inspection system and process

Confocal 3D inspection system and process

Automated wafer defect inspection system and a process of performin...

Confocal 3D inspection system and process

Confocal 3D inspection system and process

Patents Applicationslast 30 patents

Automated Wafer Defect Inspection System and a Process of Performin...

AUTOMATED WAFER DEFECT INSPECTION SYSTEM AND A PROCESS OF PERFORMIN...

AUTOMATED WAFER DEFECT INSPECTION SYSTEM AND A PROCESS OF PERFORMIN...

WAFER HOLDING MECHANISM

WAFER BEVEL INSPECTION MECHANISM

EDGE INSPECTION

COLOR IMAGING USING MONOCHROME IMAGERS

DYNAMIC FOCUSING METHOD AND APPARTUS

Wafer holding mechanism

Dynamic focusing method and apparatus

Camera module for an optical inspection system and related method o...

System for generating camera triggers

Multi-tool manager

Camera and illumination matching for inspection system

Product setup sharing for multiple inspection systems

Inspection and metrology module cluster tool

Edge inspection

Automated wafer defect inspection system and a process of performin...

Imaging system using theta-theta coordinate stage and continuous im...

Inspection tool with partial framing camrea

Confocal 3D inspection system and process

Inspection tool with partial framing/windowing camera

Switched fabric based inspection system

Data grabber with switched fabric interface

Sensor with switched fabric interface

Confocal 3D inspection system and process

Confocal 3D inspection system and process

Confocal 3D inspection system and process

Confocal 3D inspection system and process

Confocal 3D inspection system and process