Cosimo Torelli

Person

Cernusco Sul Naviglio (Milano), IT

People

Patents Grantslast 30 patents

Information Patent Grant
Reliability test with monitoring of the results
- Patent number 8,977,513
- Issue date Mar 10, 2015
- STMicroelectronics S.R.L.
- Carolina Selva
- G01 - MEASURING TESTING
Information Patent Grant
Process and system for the verification of correct functioning of a...
- Patent number 8,161,327
- Issue date Apr 17, 2012
- STMicroelectronics S.r.l.
- Carolina Selva
- G11 - INFORMATION STORAGE
Information Patent Grant
Built-in self diagnosis device for a random access memory and metho...
- Patent number 7,571,367
- Issue date Aug 4, 2009
- STMicroelectronics S.r.l.
- Carolina Selva
- G11 - INFORMATION STORAGE
Information Patent Grant
Programmable multi-mode built-in self-test and self-repair structur...
- Patent number 7,284,166
- Issue date Oct 16, 2007
- STMicroelectronics S.r.l.
- Rita Zappa
- G11 - INFORMATION STORAGE
Information Patent Grant
Static RAM with flash-clear function
- Patent number 6,963,499
- Issue date Nov 8, 2005
- STMicroelectronics S.r.l.
- Danilo Rimondi
- G11 - INFORMATION STORAGE
Information Patent Grant
Lateral DMOS transistor with first and second drain electrodes in r...
- Patent number 6,624,471
- Issue date Sep 23, 2003
- STMicroelectronics S.r.l.
- Nicola Zatelli
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Memory device with reduced power dissipation
- Patent number 6,061,286
- Issue date May 9, 2000
- SGS-Thomson Miroelectronics S.r.l.
- Andrea Baroni
- G11 - INFORMATION STORAGE
Information Patent Grant
Static ram with reduced power consumption
- Patent number 5,818,775
- Issue date Oct 6, 1998
- SGS Thomson Microelectronics S.r.l.
- Cosimo Torelli
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
RELIABILITY TEST WITH MONITORING OF THE RESULTS
- Publication number 20110087453
- Publication date Apr 14, 2011
- STMicroelectronics S.r.l.
- Carolina SELVA
- G01 - MEASURING TESTING
Information Patent Application
PROCESS AND SYSTEM FOR THE VERIFICATION OF CORRECT FUNCTIONING OF A...
- Publication number 20080256407
- Publication date Oct 16, 2008
- STMicroelectronics S.r.l.
- Carolina Selva
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
REDUCTION OF POWER CONSUMPTION OF AN INTEGRATED ELECTRONIC SYSTEM C...
- Publication number 20080151675
- Publication date Jun 26, 2008
- STMicroelectronics S.r.I.
- Cosimo Torelli
- G11 - INFORMATION STORAGE
Information Patent Application
Built-in self diagnosis device for a random access memory and metho...
- Publication number 20060028891
- Publication date Feb 9, 2006
- STMicroelectronics S.r.I.
- Carolina Selva
- G11 - INFORMATION STORAGE
Information Patent Application
Programmable multi-mode built-in self-test and self-repair structur...
- Publication number 20060031726
- Publication date Feb 9, 2006
- STMicroelectronics S.r.l.
- Rita Zappa
- G11 - INFORMATION STORAGE
Information Patent Application
Static ram with flash-clear function
- Publication number 20030231538
- Publication date Dec 18, 2003
- STMicroelectronics S.r.I.
- Danilo Rimondi
- G11 - INFORMATION STORAGE
Information Patent Application
Lateral DMOS transistor
- Publication number 20020040995
- Publication date Apr 11, 2002
- STMicroelectronics S.r.I.
- Nicola Zatelli
- H01 - BASIC ELECTRIC ELEMENTS

Cosimo Torelli

Person

Patents Grantslast 30 patents

Reliability test with monitoring of the results

Process and system for the verification of correct functioning of a...

Built-in self diagnosis device for a random access memory and metho...

Programmable multi-mode built-in self-test and self-repair structur...

Static RAM with flash-clear function

Lateral DMOS transistor with first and second drain electrodes in r...

Memory device with reduced power dissipation

Static ram with reduced power consumption

Patents Applicationslast 30 patents

RELIABILITY TEST WITH MONITORING OF THE RESULTS

PROCESS AND SYSTEM FOR THE VERIFICATION OF CORRECT FUNCTIONING OF A...

REDUCTION OF POWER CONSUMPTION OF AN INTEGRATED ELECTRONIC SYSTEM C...

Built-in self diagnosis device for a random access memory and metho...

Programmable multi-mode built-in self-test and self-repair structur...

Static ram with flash-clear function

Lateral DMOS transistor