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Craig A. Hanna
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Vestal, NY, US
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Patents Grants
last 30 patents
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Patent Grant
Methods and apparatus for emitter detection
Patent number
8,170,135
Issue date
May 1, 2012
Lockheed Martin Corporation
Craig A. Hanna
G01 - MEASURING TESTING
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Patent Grant
Methods and systems for identifying signals-of-interest
Patent number
6,867,728
Issue date
Mar 15, 2005
Lockheed Martin Corporation
Craig A. Hanna
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
Methods and apparatus for emitter detection
Publication number
20080219322
Publication date
Sep 11, 2008
Lockheed Martin Corporation
Craig A. Hanna
G01 - MEASURING TESTING