Craig A. Scheer

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North Attleboro, MA, US

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Patents Grantslast 30 patents

Information Patent Grant
Particle deposition system with enhanced speed and diameter accuracy
- Patent number 6,833,028
- Issue date Dec 21, 2004
- The Scatter Works Inc.
- Craig A. Scheer
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for distinguishing particles from subsurface d...
- Patent number 6,169,601
- Issue date Jan 2, 2001
- ADE Optical Systems
- Yuri A. Eremin
- G01 - MEASURING TESTING
Information Patent Grant
Process for particle size measurement
- Patent number 6,091,493
- Issue date Jul 18, 2000
- Scatter Works, Inc.
- John C. Stover
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Particle deposition system with enhanced speed and diameter accuracy
- Publication number 20050118332
- Publication date Jun 2, 2005
- The Scatter Works Inc.
- Craig A. Scheer
- G01 - MEASURING TESTING