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Craig Henry
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Hillsboro, OR, US
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Patents Grants
last 30 patents
Information
Patent Grant
Diagonal compound mill
Patent number
11,158,487
Issue date
Oct 26, 2021
FEI Company
Clifford Russell Bugge
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
High throughput TEM preparation processes and hardware for backside...
Patent number
10,283,317
Issue date
May 7, 2019
FEI Company
Paul Keady
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Grant
High throughput TEM preparation processes and hardware for backside...
Patent number
9,653,260
Issue date
May 16, 2017
FEI Company
Paul Keady
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Grant
Sample preparation
Patent number
7,511,282
Issue date
Mar 31, 2009
FEI Company
Enrique Agorio
G01 - MEASURING TESTING
Information
Patent Grant
Planar view sample preparation
Patent number
7,423,263
Issue date
Sep 9, 2008
FEI Company
Liang Hong
G01 - MEASURING TESTING
Information
Patent Grant
Method of measuring three-dimensional surface roughness of a structure
Patent number
7,348,556
Issue date
Mar 25, 2008
FEI Company
Prasanna Chitturi
G01 - MEASURING TESTING
Information
Patent Grant
Proximity deposition
Patent number
6,926,935
Issue date
Aug 9, 2005
FEI Company
Jason Harrison Arjavac
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Patents Applications
last 30 patents
Information
Patent Application
DIAGONAL COMPOUND MILL
Publication number
20200312618
Publication date
Oct 1, 2020
FEI Company
Clifford Russell Bugge
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
HIGH THROUGHPUT TEM PREPARATION PROCESSES AND HARDWARE FOR BACKSIDE...
Publication number
20170250055
Publication date
Aug 31, 2017
FEI Company
Paul Keady
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
High Throughput TEM Preparation Processes and Hardware for Backside...
Publication number
20130248354
Publication date
Sep 26, 2013
Paul Keady
G01 - MEASURING TESTING
Information
Patent Application
Planar view sample preparation
Publication number
20080073535
Publication date
Mar 27, 2008
Liang Hong
G01 - MEASURING TESTING
Information
Patent Application
Sample Preparation
Publication number
20070272854
Publication date
Nov 29, 2007
Enrique Agorio
G02 - OPTICS
Information
Patent Application
Method of measuring three-dimensional surface roughness of a structure
Publication number
20070018099
Publication date
Jan 25, 2007
FEI Company
Prasanna Chitturi
G01 - MEASURING TESTING
Information
Patent Application
Proximity deposition
Publication number
20040261719
Publication date
Dec 30, 2004
Jason Harrison Arjavac
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...