Craig Higgins

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Cedar Park, TX, US

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Patents Applicationslast 30 patents

Information Patent Application
METHOD TO CALIBRATE, PREDICT, AND CONTROL STOCHASTIC DEFECTS IN EUV...
- Publication number 20250104216
- Publication date Mar 27, 2025
- KLA Corporation
- Pradeep Vukkadala
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD TO CALIBRATE, PREDICT, AND CONTROL STOCHASTIC DEFECTS IN EUV...
- Publication number 20250104214
- Publication date Mar 27, 2025
- KLA Corporation
- Pradeep Vukkadala
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD TO CALIBRATE, PREDICT, AND CONTROL STOCHASTIC DEFECTS IN EUV...
- Publication number 20250104215
- Publication date Mar 27, 2025
- KLA Corporation
- Pradeep Vukkadala
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PREDICTION AND METROLOGY OF STOCHASTIC PHOTORESIST THICKNESS DEFECTS
- Publication number 20220129775
- Publication date Apr 28, 2022
- KLA Corporation
- Anatoly Burov
- G06 - COMPUTING CALCULATING COUNTING