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Craig Prater
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Santa Barbara, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Method and apparatus for enhanced photo-thermal imaging and spectro...
Patent number
12,209,950
Issue date
Jan 28, 2025
Photothermal Spectroscopy Corp.
Craig Prater
G01 - MEASURING TESTING
Information
Patent Grant
Photothermal infrared spectroscopy utilizing spatial light manipula...
Patent number
12,140,475
Issue date
Nov 12, 2024
Photothermal Spectroscopy Corp.
Derek Decker
G01 - MEASURING TESTING
Information
Patent Grant
Photothermal infrared spectroscopy utilizing spatial light manipula...
Patent number
12,066,328
Issue date
Aug 20, 2024
Photothermal Spectroscopy Corp.
Derek Decker
G01 - MEASURING TESTING
Information
Patent Grant
Autofluorescence photothermal characterization systems and methods
Patent number
11,982,621
Issue date
May 14, 2024
Photothermal Spectroscopy Corp.
Craig Prater
G01 - MEASURING TESTING
Information
Patent Grant
Fluorescence enhanced photothermal infrared spectroscopy and confoc...
Patent number
11,885,745
Issue date
Jan 30, 2024
Photothermal Spectroscopy Corp.
Craig Prater
G01 - MEASURING TESTING
Information
Patent Grant
Wide area optical photothermal infrared spectroscopy
Patent number
11,879,837
Issue date
Jan 23, 2024
Photothermal Spectroscopy Corp.
Craig Prater
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Interferometric optical photothermal infrared spectroscopy
Patent number
11,774,354
Issue date
Oct 3, 2023
Photothermal Spectroscopy Corp.
Craig Prater
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for resolution and sensitivity enhanced atomic...
Patent number
11,714,103
Issue date
Aug 1, 2023
Bruker Nano, Inc.
Craig Prater
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for enhanced photo-thermal imaging and spectro...
Patent number
11,680,892
Issue date
Jun 20, 2023
Photothermal Spectroscopy Corp.
Craig Prater
G01 - MEASURING TESTING
Information
Patent Grant
Fluorescence enhanced photothermal infrared spectroscopy and confoc...
Patent number
11,519,861
Issue date
Dec 6, 2022
Photothermal Spectroscopy Corp.
Craig Prater
G01 - MEASURING TESTING
Information
Patent Grant
Photothermal infrared spectroscopy utilizing spatial light manipula...
Patent number
11,486,761
Issue date
Nov 1, 2022
Photothermal Spectroscopy Corp.
Derek Decker
G01 - MEASURING TESTING
Information
Patent Grant
Asymmetric interferometric optical photothermal infrared spectroscopy
Patent number
11,480,518
Issue date
Oct 25, 2022
Photothermal Spectroscopy Corp.
Craig Prater
G01 - MEASURING TESTING
Information
Patent Grant
Surface sensitive atomic force microscope based infrared spectroscopy
Patent number
11,226,285
Issue date
Jan 18, 2022
Bruker Nano, Inc.
Kevin Kjoller
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for enhanced photo-thermal imaging and spectro...
Patent number
11,002,665
Issue date
May 11, 2021
Photothermal Spectroscopy Corp.
Craig Prater
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for sub-diffraction infrared imaging and spect...
Patent number
10,969,405
Issue date
Apr 6, 2021
Photothermal Spectroscopy Corp.
Roshan Shetty
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for enhanced photo-thermal imaging and spectro...
Patent number
10,942,116
Issue date
Mar 9, 2021
Photothermal Spectroscopy Corp.
Craig Prater
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for resolution and sensitivity enhanced atomic...
Patent number
10,914,755
Issue date
Feb 9, 2021
Bruker Nano, Inc.
Craig Prater
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for reducing noise in spectroscopic data at a...
Patent number
10,809,184
Issue date
Oct 20, 2020
Photothermal Spectroscopy Corp.
Craig Prater
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Nanoscale infrared spectroscopy with multi-frequency atomic force m...
Patent number
10,557,789
Issue date
Feb 11, 2020
Bruker Nano, Inc.
Craig Prater
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for infrared scanning near-field optical micro...
Patent number
10,473,693
Issue date
Nov 12, 2019
Bruker Nano, Inc.
Honghua Yang
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for chemical and optical imaging with a broadb...
Patent number
10,241,131
Issue date
Mar 26, 2019
Bruker Nano, Inc.
Craig Prater
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for resolution and sensitivity enhanced atomic...
Patent number
10,228,388
Issue date
Mar 12, 2019
Bruker Nano, Inc.
Craig Prater
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for infrared scattering scanning near-field op...
Patent number
10,228,389
Issue date
Mar 12, 2019
Bruker Nano, Inc.
Honghua Yang
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for infrared scattering scanning near-field op...
Patent number
10,082,523
Issue date
Sep 25, 2018
Bruker Nano, Inc.
Honghua Yang
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for infrared scattering scanning near-field op...
Patent number
9,778,282
Issue date
Oct 3, 2017
Anasys Instruments
Honghua Yang
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for infrared scattering scanning near-field op...
Patent number
9,658,247
Issue date
May 23, 2017
Anasys Instruments
Honghua Yang
G01 - MEASURING TESTING
Information
Patent Grant
Closed loop controller and method for fast scanning probe microscopy
Patent number
9,523,707
Issue date
Dec 20, 2016
Bruker Nano, Inc.
Jian Shi
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Method and apparatus for infrared scattering scanning near-field op...
Patent number
9,372,154
Issue date
Jun 21, 2016
Anasys Instruments
Craig Prater
G01 - MEASURING TESTING
Information
Patent Grant
Closed loop controller and method for fast scanning probe microscopy
Patent number
9,244,096
Issue date
Jan 26, 2016
Bruke Nano, Inc.
Jian Shi
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Multiple modulation heterodyne infrared spectroscopy
Patent number
9,134,341
Issue date
Sep 15, 2015
Craig Prater
B82 - NANO-TECHNOLOGY
Patents Applications
last 30 patents
Information
Patent Application
AUTOMATED SPECTROSCOPIC ANALYSIS OF MICRON-SCALE MICROPLASTIC PARTI...
Publication number
20250020569
Publication date
Jan 16, 2025
Photothermal Spectroscopy Corp.
Craig Prater
G01 - MEASURING TESTING
Information
Patent Application
PHOTOTHERMAL INFRARED SPECTROSCOPY UTILIZING SPATIAL LIGHT MANIPULA...
Publication number
20250003797
Publication date
Jan 2, 2025
Photothermal Spectroscopy Corp.
Derek Decker
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR ENHANCED PHOTO-THERMAL IMAGING AND SPECTRO...
Publication number
20250003865
Publication date
Jan 2, 2025
Photothermal Spectroscopy Corp.
Craig Prater
G01 - MEASURING TESTING
Information
Patent Application
AUTOFLUORESCENCE ENHANCED PHOTOTHERMAL INFRARED SPECTROSCOPY
Publication number
20240361243
Publication date
Oct 31, 2024
Photothermal Spectroscopy Corp.
Craig Prater
G01 - MEASURING TESTING
Information
Patent Application
ASYMMETRIC QUADRATURE INTERFEROMETRY FOR THIN FILM INTERFERENCE SUP...
Publication number
20240353324
Publication date
Oct 24, 2024
Photothermal Spectroscopy Corp.
Craig Prater
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR IMPROVED COMPOSITE MULTI-WAVELENGTH PHOTOT...
Publication number
20240280477
Publication date
Aug 22, 2024
Photothermal Spectroscopy Corp.
Craig Prater
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Autofluorescence Photothermal Characterization Systems and Methods
Publication number
20240118208
Publication date
Apr 11, 2024
Photothermal Spectroscopy Corp.
Craig Prater
G01 - MEASURING TESTING
Information
Patent Application
FLUORESCENCE ENHANCED PHOTOTHERMAL INFRARED SPECTROSCOPY AND CONFOC...
Publication number
20240110872
Publication date
Apr 4, 2024
Photothermal Spectroscopy Corp.
Craig Prater
G01 - MEASURING TESTING
Information
Patent Application
WIDE AREA OPTICAL PHOTOTHERMAL INFRARED SPECTROSCOPY
Publication number
20240060885
Publication date
Feb 22, 2024
Photothermal Spectroscopy Corp.
Craig Prater
C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information
Patent Application
ASYMMETRIC INTERFEROMETRIC OPTICAL PHOTOTHERMAL INFRARED SPECTROSCOPY
Publication number
20240044782
Publication date
Feb 8, 2024
Photothermal Spectroscopy Corp.
Craig Prater
G01 - MEASURING TESTING
Information
Patent Application
PHOTOTHERMAL INFRARED SPECTROSCOPY UTILIZING SPATIAL LIGHT MANIPULA...
Publication number
20240011830
Publication date
Jan 11, 2024
Photothermal Spectroscopy Corp.
Derek Decker
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR FIBER OPTIC PHOTOTHERMAL IMAGING AND SPECT...
Publication number
20230251190
Publication date
Aug 10, 2023
Photothermal Spectroscopy Corp.
Craig PRATER
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Application
INTERFEROMETRIC OPTICAL PHOTOTHERMAL INFRARED SPECTROSCOPY
Publication number
20230236118
Publication date
Jul 27, 2023
Photothermal Spectroscopy Corp.
Craig Prater
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR ENHANCED PHOTO-THERMAL IMAGING AND SPECTRO...
Publication number
20230236112
Publication date
Jul 27, 2023
Photothermal Spectroscopy Corp.
Craig Prater
G01 - MEASURING TESTING
Information
Patent Application
PHOTOTHERMAL INFRARED SPECTROSCOPY UTILIZING SPATIAL LIGHT MANIPULA...
Publication number
20230131208
Publication date
Apr 27, 2023
Photothermal Spectroscopy Corp.
Derek Decker
G01 - MEASURING TESTING
Information
Patent Application
FLUORESCENCE ENHANCED PHOTOTHERMAL INFRARED SPECTROSCOPY AND CONFOC...
Publication number
20230129884
Publication date
Apr 27, 2023
Photothermal Spectroscopy Corp.
Craig Prater
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR HIGH PERFORMANCE WIDE FIELD PHOTOTHERMAL I...
Publication number
20230063843
Publication date
Mar 2, 2023
Photothermal Spectroscopy Corp.
Craig Prater
G01 - MEASURING TESTING
Information
Patent Application
FLUORESCENCE ENHANCED PHOTOTHERMAL INFRARED SPECTROSCOPY AND CONFOC...
Publication number
20220357275
Publication date
Nov 10, 2022
Photothermal Spectroscopy Corp.
Craig Prater
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR ENHANCED PHOTO-THERMAL IMAGING AND SPECTRO...
Publication number
20220065772
Publication date
Mar 3, 2022
Photothermal Spectroscopy Corp.
Craig Prater
G01 - MEASURING TESTING
Information
Patent Application
FLUORESCENCE ENHANCED PHOTOTHERMAL INFRARED SPECTROSCOPY AND CONFOC...
Publication number
20220018773
Publication date
Jan 20, 2022
Photothermal Spectroscopy Corp.
Craig Prater
G01 - MEASURING TESTING
Information
Patent Application
WIDE AREA OPTICAL PHOTOTHERMAL INFRARED SPECTROSCOPY
Publication number
20210215601
Publication date
Jul 15, 2021
Photothermal Spectroscopy Corp.
Craig Prater
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
ASYMMETRIC INTERFEROMETRIC OPTICAL PHOTOTHERMAL INFRARED SPECTROSCOPY
Publication number
20210164894
Publication date
Jun 3, 2021
Photothermal Spectroscopy Corp.
Craig Prater
G01 - MEASURING TESTING
Information
Patent Application
Method and Apparatus for Resolution and Sensitivity Enhanced Atomic...
Publication number
20210165019
Publication date
Jun 3, 2021
Bruker Nano, Inc.
Craig Prater
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR REDUCING NOISE IN SPECTROSCOPIC DATA AT A...
Publication number
20200309681
Publication date
Oct 1, 2020
Craig Prater
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Surface Sensitive Atomic Force Microscope Based Infrared Spectroscopy
Publication number
20200217874
Publication date
Jul 9, 2020
Bruker Nano, Inc.
Kevin Kjoller
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR ENHANCED PHOTO-THERMAL IMAGING AND SPECTRO...
Publication number
20200025677
Publication date
Jan 23, 2020
Photothermal Spectroscopy Corp.
Craig Prater
G01 - MEASURING TESTING
Information
Patent Application
Method and Apparatus for Resolution and Sensitivity Enhanced Atomic...
Publication number
20190391177
Publication date
Dec 26, 2019
Bruker Nano, Inc.
Craig Prater
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR ENHANCED PHOTO-THERMAL IMAGING AND SPECTRO...
Publication number
20190120753
Publication date
Apr 25, 2019
Photothermal Spectroscopy Corp.
Craig Prater
G01 - MEASURING TESTING
Information
Patent Application
Surface Sensitive Atomic Force Microscope Based Infrared Spectroscopy
Publication number
20190011358
Publication date
Jan 10, 2019
Bruker Nano, Inc.
Kevin Kjoller
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APARATUS FOR INFRARED SCANNING NEAR-FIELD OPTICAL MICROS...
Publication number
20180259553
Publication date
Sep 13, 2018
Anasys Instruments Corp.
Honghua Yang
G01 - MEASURING TESTING