Craig R. Chafin

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Colorado Springs, CO, US

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Patents Grantslast 30 patents

Information Patent Grant
Scatter gather list for data integrity
- Patent number 8,868,517
- Issue date Oct 21, 2014
- LSI Corporation
- Carl E. Gygi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Hardware queue for transparent debug
- Patent number 8,839,037
- Issue date Sep 16, 2014
- LSI Corporation
- Carl E. Gygi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods and apparatus for burst data transfers between double data...
- Patent number 8,606,989
- Issue date Dec 10, 2013
- LSI Corporation
- Craig R. Chafin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Dynamic on-chip logic analysis
- Patent number 7,496,474
- Issue date Feb 24, 2009
- LSI Corporation
- Adam S. Browen
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for using a lessened load to measure signal skew...
- Patent number 7,219,270
- Issue date May 15, 2007
- LSI Logic Corporation
- Jeffrey S. Brown
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
SCATTER GATHER LIST FOR DATA INTEGRITY
- Publication number 20130262398
- Publication date Oct 3, 2013
- LSI Corporation
- Carl E. Gygi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
HARDWARE QUEUE FOR TRANSPARENT DEBUG
- Publication number 20130091388
- Publication date Apr 11, 2013
- LSI Corporation
- Carl E. Gygi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
COMPENSATING FOR JITTER DURING DDR3 MEMORY DELAY LINE TRAINING
- Publication number 20120296598
- Publication date Nov 22, 2012
- LSI Corporation
- Craig R. Chafin
- G11 - INFORMATION STORAGE
Information Patent Application
METHODS AND APPARATUS FOR BURST DATA TRANSFERS BETWEEN DOUBLE DATA...
- Publication number 20120054424
- Publication date Mar 1, 2012
- Craig R. Chafin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Dynamic on-chip logic analysis
- Publication number 20070112544
- Publication date May 17, 2007
- LSI Logic Corporation
- Adam S. Browen
- G01 - MEASURING TESTING