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Craig Spohr
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Kirkwood, MO, US
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Patents Grants
last 30 patents
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Patent Grant
Method of calibrating a semiconductor wafer drying apparatus
Patent number
6,649,883
Issue date
Nov 18, 2003
MEMC Electronic Materials, Inc.
Yoshio Iwamoto
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
Apparatus for cleaning semiconductor wafers
Patent number
6,318,389
Issue date
Nov 20, 2001
MEMC Electronic Materials, Inc.
Philip R. Schmidt
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
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Patent Application
Method of calibrating a semiconductor wafer drying apparatus
Publication number
20020148826
Publication date
Oct 17, 2002
Yoshio Iwamoto
H01 - BASIC ELECTRIC ELEMENTS