Craig William Christian

Person

Buda, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
Run-to-run control method for automated control of metal deposition...
- Patent number 7,324,865
- Issue date Jan 29, 2008
- Advanced Micro Devices, Inc.
- Thomas Sonderman
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Control mechanism for matching process parameters in a multi-chambe...
- Patent number 6,684,122
- Issue date Jan 27, 2004
- Advanced Micro Devices, Inc.
- Craig W. Christian
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Method and apparatus for run-to-run control of deposition process
- Patent number 6,650,957
- Issue date Nov 18, 2003
- Advanced Micro Devices, Inc.
- William Jarrett Campbell
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Advanced process control (APC) of copper thickness for chemical mec...
- Patent number 6,630,360
- Issue date Oct 7, 2003
- Advanced Micro Devices, Inc.
- Craig William Christian
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for reducing deposition variation by modeling...
- Patent number 6,512,991
- Issue date Jan 28, 2003
- Advanced Micro Devices, Inc.
- Bradley M. Davis
- G01 - MEASURING TESTING
Information Patent Grant
Run-to-run etch control by feeding forward measured metal thickness
- Patent number 6,500,681
- Issue date Dec 31, 2002
- Advanced Micro Devices, Inc.
- Craig William Christian
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for determining measurement frequency based on...
- Patent number 6,469,518
- Issue date Oct 22, 2002
- Advanced Micro Devices, Inc.
- Bradley M. Davis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for filling trenches
- Patent number 6,454,899
- Issue date Sep 24, 2002
- Advanced Micro Devices, Inc.
- William J. Campbell
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for controlling optical properties of antireflective coatings
- Patent number 6,403,151
- Issue date Jun 11, 2002
- Advanced Micro Devices, Inc.
- Bradley Marc Davis
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Method for filling trenches
- Patent number 6,284,622
- Issue date Sep 4, 2001
- Advanced Micro Devices, Inc.
- William J. Campbell
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Interlayer between titanium nitride and high density plasma oxide
- Patent number 6,271,112
- Issue date Aug 7, 2001
- Advanced Micro Devices, Inc.
- Christopher L. Wooten
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for calculating cluster tool performance metrics...
- Patent number 5,914,879
- Issue date Jun 22, 1999
- Advanced Micro Devices
- Qingsu Wang
- G05 - CONTROLLING REGULATING
Information Patent Grant
Semicondutor having selectively enhanced field oxide areas and meth...
- Patent number 5,661,335
- Issue date Aug 26, 1997
- Advanced Micro Devices, Inc.
- Mohammed Anjum
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit fabrication using a metal silicide having a sput...
- Patent number 5,550,084
- Issue date Aug 27, 1996
- Advanced Micro Devices, Inc.
- Mohammed Anjum
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for forming a silicide using ion beam mixing
- Patent number 5,470,794
- Issue date Nov 28, 1995
- Advanced Micro Devices
- Mohammed Anjum
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for low energy implantation of argon to control titanium sil...
- Patent number 5,444,024
- Issue date Aug 22, 1995
- Advanced Micro Devices, Inc.
- Mohammed Anjum
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Germanium implant for use with ultra-shallow junctions
- Patent number 5,401,674
- Issue date Mar 28, 1995
- Advanced Micro Devices
- Mohammed Anjum
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of fabricating semiconductor gate electrode with fluorine mi...
- Patent number 5,393,676
- Issue date Feb 28, 1995
- Advanced Micro Devices, Inc.
- Mohammed Anjum
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of making a semiconductor having selectively enhanced field...
- Patent number 5,372,951
- Issue date Dec 13, 1994
- Advanced Micro Devices, Inc.
- Mohammed Anjum
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Advanced process control (APC) of copper thickness for chemical mec...
- Publication number 20030129774
- Publication date Jul 10, 2003
- Craig William Christian
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and apparatus for controlling a thickness of a copper film
- Publication number 20020192944
- Publication date Dec 19, 2002
- Thomas J. Sonderman
- H01 - BASIC ELECTRIC ELEMENTS

Craig William Christian

Person

Patents Grantslast 30 patents

Run-to-run control method for automated control of metal deposition...

Control mechanism for matching process parameters in a multi-chambe...

Method and apparatus for run-to-run control of deposition process

Advanced process control (APC) of copper thickness for chemical mec...

Method and apparatus for reducing deposition variation by modeling...

Run-to-run etch control by feeding forward measured metal thickness

Method and apparatus for determining measurement frequency based on...

Apparatus for filling trenches

Method for controlling optical properties of antireflective coatings

Method for filling trenches

Interlayer between titanium nitride and high density plasma oxide

System and method for calculating cluster tool performance metrics...

Semicondutor having selectively enhanced field oxide areas and meth...

Integrated circuit fabrication using a metal silicide having a sput...

Method for forming a silicide using ion beam mixing

Method for low energy implantation of argon to control titanium sil...

Germanium implant for use with ultra-shallow junctions

Method of fabricating semiconductor gate electrode with fluorine mi...

Method of making a semiconductor having selectively enhanced field...

Patents Applicationslast 30 patents

Advanced process control (APC) of copper thickness for chemical mec...

Method and apparatus for controlling a thickness of a copper film