Cristian Paduraru

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Pleasanton, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
System and method for monitoring wafer stress
- Patent number 8,293,023
- Issue date Oct 23, 2012
- Lam Research Corporation
- John Valcore
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods for correlating gap value to meniscus stability in processi...
- Patent number 8,287,656
- Issue date Oct 16, 2012
- Lam Research Corporation
- G. Grant Peng
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Methods of and apparatus for correlating gap value to meniscus stab...
- Patent number 8,051,863
- Issue date Nov 8, 2011
- Lam Research Corporation
- G. Grant Peng
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND METHOD FOR MONITORING WAFER STRESS
- Publication number 20140083463
- Publication date Mar 27, 2014
- John Valcore
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS FOR CORRELATING GAP VALUE TO MENISCUS STABILITY IN PROCESSI...
- Publication number 20120006359
- Publication date Jan 12, 2012
- G. Grant Peng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR MONITORING WAFER STRESS
- Publication number 20110094538
- Publication date Apr 28, 2011
- John Valcore
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS OF AND APPARATUS FOR CORRELATING GAP VALUE TO MENISCUS STAB...
- Publication number 20090101173
- Publication date Apr 23, 2009
- G. Grant Peng
- H01 - BASIC ELECTRIC ELEMENTS