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Cristian Pavao-Moreira
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Patents Grants
last 30 patents
Information
Patent Grant
Communication unit, integrated circuits and method for clock and da...
Patent number
12,228,670
Issue date
Feb 18, 2025
NXP USA, INC.
Olivier Doaré
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Radar system
Patent number
12,216,226
Issue date
Feb 4, 2025
NXP B.V.
Ulrich Moehlmann
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Power control for radar applications and method thereof
Patent number
12,196,881
Issue date
Jan 14, 2025
NXP USA, INC.
Gilles Montoriol
G01 - MEASURING TESTING
Information
Patent Grant
Battery management system and method
Patent number
12,109,897
Issue date
Oct 8, 2024
NXP B.V.
Alphons Litjes
B60 - VEHICLES IN GENERAL
Information
Patent Grant
Radar unit and corresponding operating method
Patent number
12,038,528
Issue date
Jul 16, 2024
NXP USA, INC.
Hugo Albert Vallee
G01 - MEASURING TESTING
Information
Patent Grant
Duty cycle detector self-testing
Patent number
11,815,553
Issue date
Nov 14, 2023
NXP USA, INC.
Cristian Pavao Moreira
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Radar transceiver
Patent number
11,796,635
Issue date
Oct 24, 2023
NXP USA, INC.
Birama Goumballa
G01 - MEASURING TESTING
Information
Patent Grant
Temperature sensor system, radar device and method therefor
Patent number
11,353,550
Issue date
Jun 7, 2022
NXP USA, INC.
Matthis Bouchayer
G01 - MEASURING TESTING
Information
Patent Grant
Communication unit and method for clock distribution and synchroniz...
Patent number
11,320,526
Issue date
May 3, 2022
NXP USA, INC.
Didier Salle
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Chirp linearity detector for radar
Patent number
11,143,746
Issue date
Oct 12, 2021
NXP USA, INC.
Jean-Stéphane Vigier
G01 - MEASURING TESTING
Information
Patent Grant
Phase preset for fast chirp PLL
Patent number
11,131,763
Issue date
Sep 28, 2021
NXP USA, INC.
Jean-Stephane Vigier
G01 - MEASURING TESTING
Information
Patent Grant
Boosted return time for fast chirp PLL and calibration method
Patent number
11,131,762
Issue date
Sep 28, 2021
NXP USA, INC.
Jean-Stephane Vigier
G01 - MEASURING TESTING
Information
Patent Grant
Communication unit, integrated circuits and method for clock and da...
Patent number
11,054,513
Issue date
Jul 6, 2021
NXP USA, INC.
Olivier Doaré
G01 - MEASURING TESTING
Information
Patent Grant
Embedded test circuitry and method therefor
Patent number
11,018,635
Issue date
May 25, 2021
NXP USA, INC.
Stephane Thuriés
G01 - MEASURING TESTING
Information
Patent Grant
Methods and apparatuses for digitally controlled oscillator frequen...
Patent number
10,992,304
Issue date
Apr 27, 2021
NXP USA, INC.
Cristian Pavao Moreira
G01 - MEASURING TESTING
Information
Patent Grant
Temperature sensor system, radar device and method
Patent number
10,816,643
Issue date
Oct 27, 2020
NXP B.V.
Matthis Bouchayer
G01 - MEASURING TESTING
Information
Patent Grant
Voltage-controlled-oscillator circuit
Patent number
10,763,864
Issue date
Sep 1, 2020
NXP USA, INC.
Birama Goumballa
G01 - MEASURING TESTING
Information
Patent Grant
Duty cycle monitor circuit and method for duty cycle monitoring
Patent number
10,700,672
Issue date
Jun 30, 2020
NXP USA, INC.
Pierre Savary
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Temperature sensor and calibration method thereof having high accuracy
Patent number
10,648,870
Issue date
May 12, 2020
NXP USA, INC.
Birama Goumballa
G05 - CONTROLLING REGULATING
Information
Patent Grant
Communication unit, integrated circuit and method for clock distrib...
Patent number
10,644,872
Issue date
May 5, 2020
NXP USA, INC.
Cristian Pavao Moreira
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Communication unit, integrated circuit and method for clock distrib...
Patent number
10,615,958
Issue date
Apr 7, 2020
NXP USA, INC.
Jean-Stephane Vigier
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
System and method for calibrating a time to digital converter device
Patent number
10,579,021
Issue date
Mar 3, 2020
NXP USA, INC.
Didier Salle
G04 - HOROLOGY
Information
Patent Grant
Digital synthesizer, communication unit and method therefor
Patent number
10,496,040
Issue date
Dec 3, 2019
NXP USA, INC.
Didier Salle
G01 - MEASURING TESTING
Information
Patent Grant
Baseband amplifier circuit
Patent number
10,498,299
Issue date
Dec 3, 2019
NXP USA, INC.
Charaf Eddine Souria
G01 - MEASURING TESTING
Information
Patent Grant
Digitally controlled oscillator with temperature compensation
Patent number
10,454,482
Issue date
Oct 22, 2019
NXP USA, INC.
Cristian Pavao-Moreira
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Phase shifter
Patent number
10,418,972
Issue date
Sep 17, 2019
NXP B.V.
Stephane Thuries
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Method and apparatus for generating a charge pump control signal
Patent number
10,381,051
Issue date
Aug 13, 2019
NXP USA, INC.
Birama Goumballa
G05 - CONTROLLING REGULATING
Information
Patent Grant
Digital synthesizer, communication unit and method therefor
Patent number
10,367,464
Issue date
Jul 30, 2019
NXP USA, INC.
Didier Salle
G01 - MEASURING TESTING
Information
Patent Grant
Integrated calibration circuit and a method for calibration of a fi...
Patent number
10,250,213
Issue date
Apr 2, 2019
NXP USA, Inx.
Cristian Pavao-Moreira
G01 - MEASURING TESTING
Information
Patent Grant
Digital synthesizer, communication unit and method therefor
Patent number
10,236,898
Issue date
Mar 19, 2019
NXP USA, INC.
Didier Salle
H03 - BASIC ELECTRONIC CIRCUITRY
Patents Applications
last 30 patents
Information
Patent Application
RADAR TRANSMITTER OUTPUT POWER CALIBRATION VIA A STANDING WAVE SIGN...
Publication number
20240377509
Publication date
Nov 14, 2024
NXP B.V.
Mohamad El Ozeir
G01 - MEASURING TESTING
Information
Patent Application
RADAR POWER CALIBRATION WITH MISMATCH COMPENSATION
Publication number
20240219561
Publication date
Jul 4, 2024
NXP B.V.
Mohamad El Ozeir
G01 - MEASURING TESTING
Information
Patent Application
A HYBRID SUPPLY MONITORING SYSTEM FOR A RADAR DEVICE
Publication number
20240125897
Publication date
Apr 18, 2024
NXP B.V.
Cristian Pavao Moreira
G01 - MEASURING TESTING
Information
Patent Application
CASCADED RADAR SYSTEM WITH IMPROVED AVAILABILITY
Publication number
20240077578
Publication date
Mar 7, 2024
NXP B.V.
Cristian Pavao Moreira
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS AND METHODS FOR OPTIMIZING COMBINED SENSING AND COMMUNICA...
Publication number
20230361464
Publication date
Nov 9, 2023
NXP B.V.
Alphons Litjes
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
BIAS GENERATOR TESTING USING GROUPED BIAS CURRENTS
Publication number
20230333161
Publication date
Oct 19, 2023
NXP B.V.
Cristian Pavao Moreira
G01 - MEASURING TESTING
Information
Patent Application
BATTERY MANAGEMENT SYSTEM AND METHOD
Publication number
20230331090
Publication date
Oct 19, 2023
NXP B.V.
Alphons Litjes
B60 - VEHICLES IN GENERAL
Information
Patent Application
System and Method for Combined Performing of Wireless Communication...
Publication number
20230117789
Publication date
Apr 20, 2023
NXP B.V.
Alexander Vogt
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
System and Method for Combined Performing of Wireless Communication...
Publication number
20230122173
Publication date
Apr 20, 2023
NXP B.V.
Cristian Pavao Moreira
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
RADAR SYSTEM
Publication number
20220365173
Publication date
Nov 17, 2022
NXP B.V.
Ulrich Moehlmann
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
RADAR UNIT AND CORRESPONDING OPERATING METHOD
Publication number
20220107388
Publication date
Apr 7, 2022
NXP USA, Inc.
Hugo Albert Vallee
G01 - MEASURING TESTING
Information
Patent Application
RADAR TRANSCEIVER
Publication number
20220050174
Publication date
Feb 17, 2022
NXP USA, Inc.
Birama Goumballa
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
POWER CONTROL FOR RADAR APPLICATIONS AND METHOD THEREOF
Publication number
20220018929
Publication date
Jan 20, 2022
NXP USA, Inc.
Gilles Montoriol
G01 - MEASURING TESTING
Information
Patent Application
DUTY CYCLE DETECTOR SELF-TESTING
Publication number
20210389372
Publication date
Dec 16, 2021
NXP USA, Inc.
Cristian Pavao Moreira
G01 - MEASURING TESTING
Information
Patent Application
Chirp linearity detector for radar
Publication number
20210302535
Publication date
Sep 30, 2021
NXP USA, Inc.
Jean-Stéphane VIGIER
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
METHODS AND APPARATUSES FOR DIGITALLY CONTROLLED OSCILLATOR FREQUEN...
Publication number
20200366299
Publication date
Nov 19, 2020
NXP USA, Inc.
Cristian Pavao Moreira
G01 - MEASURING TESTING
Information
Patent Application
DUTY CYCLE MONITOR CIRCUIT AND METHOD FOR DUTY CYCLE MONITORING
Publication number
20200136599
Publication date
Apr 30, 2020
NXP USA, Inc.
Pierre SAVARY
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
FREQUENCY DRIFT DETECTOR, COMMUNICATION UNIT AND METHOD THEREFOR
Publication number
20200127669
Publication date
Apr 23, 2020
NXP USA, Inc.
Pierre Pascal Savary
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Application
TEMPERATURE SENSOR SYSTEM, RADAR DEVICE AND METHOD THEREFOR
Publication number
20200057138
Publication date
Feb 20, 2020
NXP USA, Inc.
Matthis Bouchayer
G01 - MEASURING TESTING
Information
Patent Application
EMBEDDED TEST CIRCUITRY AND METHOD THEREFOR
Publication number
20200059203
Publication date
Feb 20, 2020
NXP USA, Inc.
Stephane Thuries
G01 - MEASURING TESTING
Information
Patent Application
COMMUNICATION UNIT AND METHOD FOR CLOCK DISTRIBUTION AND SYNCHRONIZ...
Publication number
20200003882
Publication date
Jan 2, 2020
NXP USA, Inc.
Didier Salle
G01 - MEASURING TESTING
Information
Patent Application
COMMUNICATION UNIT, INTEGRATED CIRCUITS AND METHOD FOR CLOCK AND DA...
Publication number
20200003862
Publication date
Jan 2, 2020
NXP USA, Inc.
Olivier Doaré
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
COMMUNICATION UNIT, INTEGRATED CIRCUITS AND METHOD FOR CLOCK AND DA...
Publication number
20200003883
Publication date
Jan 2, 2020
NXP USA, Inc.
Olivier Doaré
G01 - MEASURING TESTING
Information
Patent Application
COMMUNICATION UNIT, INTEGRATED CIRCUIT AND METHOD FOR CLOCK DISTRIB...
Publication number
20200007309
Publication date
Jan 2, 2020
NXP USA, Inc.
Jean-Stephane Vigier
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
COMMUNICATION UNIT, INTEGRATED CIRCUIT AND METHOD FOR CLOCK DISTRIB...
Publication number
20200007310
Publication date
Jan 2, 2020
NXP USA, Inc.
Cristian Pavao Moreira
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
PHASE PRESET FOR FAST CHIRP PLL
Publication number
20190377076
Publication date
Dec 12, 2019
NXP USA, Inc.
Jean-Stephane Vigier
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
BOOSTED RETURN TIME FOR FAST CHIRP PLL AND CALIBRATION METHOD
Publication number
20190377078
Publication date
Dec 12, 2019
NXP USA, Inc.
Jean-Stephane Vigier
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
VOLTAGE-CONTROLLED-OSCILLATOR CIRCUIT
Publication number
20190181867
Publication date
Jun 13, 2019
NXP USA, Inc.
Birama Goumballa
G01 - MEASURING TESTING
Information
Patent Application
PHASE SHIFTER
Publication number
20190013797
Publication date
Jan 10, 2019
NXP B.V.
Stephane Thuries
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
PHASE SHIFTER
Publication number
20190013814
Publication date
Jan 10, 2019
NXP B.V.
Stephane Thuries
G01 - MEASURING TESTING