Cristian VENANZI

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Karlsruhe, DE

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Patents Grantslast 30 patents

Information Patent Grant
Measurement arrangement for X-ray radiation for gap-free 1D measure...
- Patent number 12,031,924
- Issue date Jul 9, 2024
- Jürgen Fink
- G01 - MEASURING TESTING
Information Patent Grant
Measuring arrangement for x-ray radiation having reduced parallax e...
- Patent number 11,788,975
- Issue date Oct 17, 2023
- Jürgen Fink
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MEASURING ARRANGEMENT FOR X-RAY RADIATION HAVING REDUCED PARALLAX E...
- Publication number 20220163465
- Publication date May 26, 2022
- Bruker AXS GmbH
- Jürgen FINK
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT ARRANGEMENT FOR X-RAY RADIATION FOR GAP-FREE ID MEASUR...
- Publication number 20220034825
- Publication date Feb 3, 2022
- Bruker AXS GmbH
- Jürgen FINK
- G01 - MEASURING TESTING