Cristiano Cenci

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Castel De Piano, IT

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Patents Grantslast 30 patents

Information Patent Grant
Method and device for testing a phase locked loop
- Patent number 7,477,110
- Issue date Jan 13, 2009
- NXP B.V.
- Jose De Jesus Pineda De Gyvez
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method and device for testing a phase locked loop
- Publication number 20070132525
- Publication date Jun 14, 2007
- KONINKLIJKE PHILIPS ELECTRONICS N.C.
- Jose De Jesus Pineda de Gyvez
- H03 - BASIC ELECTRONIC CIRCUITRY