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Cristiano L. Niclass
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Cupertino, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
SPAD-based photon detectors with multi-phase sampling TDCs
Patent number
12,199,197
Issue date
Jan 14, 2025
Apple Inc.
Shingo Mandai
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Setting parameters of optical transmitter using receive-side control
Patent number
11,876,557
Issue date
Jan 16, 2024
Apple Inc.
Harish Venkataraman
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Time-of-flight depth mapping with parallax compensation
Patent number
11,681,027
Issue date
Jun 20, 2023
Apple Inc.
Cristiano L Niclass
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Selection of pulse repetition intervals for sensing time of flight
Patent number
11,500,094
Issue date
Nov 15, 2022
Apple Inc.
Thierry Oggier
G01 - MEASURING TESTING
Information
Patent Grant
SPAD-based photon detectors with multi-phase sampling TDCs
Patent number
11,476,372
Issue date
Oct 18, 2022
Apple Inc.
Shingo Mandai
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Back-illuminated single-photon avalanche diode
Patent number
11,271,031
Issue date
Mar 8, 2022
Apple Inc.
Shingo Mandai
G01 - MEASURING TESTING
Information
Patent Grant
Breakdown voltage monitoring for avalanche diodes
Patent number
11,233,966
Issue date
Jan 25, 2022
Apple Inc.
Cristiano L. Niclass
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Spatial temporal weighting in a SPAD detector
Patent number
10,962,628
Issue date
Mar 30, 2021
Apple Inc.
Moshe Laifenfeld
G01 - MEASURING TESTING
Information
Patent Grant
Management of histogram memory for a single-photon avalanche diode...
Patent number
10,928,492
Issue date
Feb 23, 2021
Apple Inc.
Shingo Mandai
G01 - MEASURING TESTING
Information
Patent Grant
Time-of-flight depth mapping with parallax compensation
Patent number
10,830,879
Issue date
Nov 10, 2020
Apple Inc.
Cristiano L Niclass
G01 - MEASURING TESTING
Information
Patent Grant
SPAD detector having modulated sensitivity
Patent number
10,801,886
Issue date
Oct 13, 2020
Apple Inc.
Shingo Mandai
G01 - MEASURING TESTING
Information
Patent Grant
Imaging system with synchronized scan and sensing
Patent number
10,795,001
Issue date
Oct 6, 2020
Apple Inc.
Cristiano L. Niclass
G01 - MEASURING TESTING
Information
Patent Grant
Adaptive transmission power control for a LIDAR
Patent number
10,775,507
Issue date
Sep 15, 2020
Apple Inc.
Shingo Mandai
G01 - MEASURING TESTING
Information
Patent Grant
Stacked backside illuminated SPAD array
Patent number
10,658,419
Issue date
May 19, 2020
Apple Inc.
Shingo Mandai
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Signal acquisition in a SPAD detector
Patent number
10,656,251
Issue date
May 19, 2020
Apple Inc.
Shingo Mandai
G01 - MEASURING TESTING
Information
Patent Grant
Stacked backside illuminated SPAD array
Patent number
10,438,987
Issue date
Oct 8, 2019
Apple Inc.
Shingo Mandai
G01 - MEASURING TESTING
Information
Patent Grant
Light detection and ranging sensor
Patent number
10,324,171
Issue date
Jun 18, 2019
Apple Inc.
Cristiano L. Niclass
G01 - MEASURING TESTING
Information
Patent Grant
Radiation source with a small-angle scanning array
Patent number
10,305,247
Issue date
May 28, 2019
Apple Inc.
Richard E. Bills
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
Reconfigurable Time of Flight Proximity Sensor with Near-Field and...
Publication number
20230258785
Publication date
Aug 17, 2023
Apple Inc.
Shingo Mandai
G01 - MEASURING TESTING
Information
Patent Application
SPAD-Based Photon Detectors with Multi-Phase Sampling TDCS
Publication number
20230015431
Publication date
Jan 19, 2023
Apple Inc.
Shingo Mandai
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Single-chip optical transceiver
Publication number
20220404475
Publication date
Dec 22, 2022
Apple Inc.
Arnaud Laflaquière
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Selection of pulse repetition intervals for sensing time of flight
Publication number
20220350026
Publication date
Nov 3, 2022
Apple Inc.
Moshe Laifenfeld
G01 - MEASURING TESTING
Information
Patent Application
Time-of-flight depth sensing with improved linearity
Publication number
20220244391
Publication date
Aug 4, 2022
Apple Inc.
Shingo Mandai
G01 - MEASURING TESTING
Information
Patent Application
Transistor Integration with Stacked Single-Photon Avalanche Diode (...
Publication number
20220102404
Publication date
Mar 31, 2022
Apple Inc.
Hong Wei Lee
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Time-of-flight depth mapping with parallax compensation
Publication number
20210003680
Publication date
Jan 7, 2021
Apple Inc.
Cristiano L. Niclass
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Selection of pulse repetition intervals for sensing time of flight
Publication number
20200386890
Publication date
Dec 10, 2020
Apple Inc.
Thierry Oggier
G01 - MEASURING TESTING
Information
Patent Application
Back-Illuminated Single-Photon Avalanche Diode
Publication number
20200286946
Publication date
Sep 10, 2020
Apple Inc.
Shingo Mandai
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Management of Histogram Memory for a Single-Photon Avalanche Diode...
Publication number
20200278429
Publication date
Sep 3, 2020
Apple Inc.
Shingo Mandai
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Imaging system with synchronized scan and sensing
Publication number
20200158831
Publication date
May 21, 2020
Apple Inc.
Cristiano L. Niclass
G01 - MEASURING TESTING
Information
Patent Application
EARLY-LATE PULSE COUNTING FOR LIGHT EMITTING DEPTH SENSORS
Publication number
20190018119
Publication date
Jan 17, 2019
Apple Inc.
Moshe Laifenfeld
G01 - MEASURING TESTING
Information
Patent Application
Time-of-flight depth mapping with parallax compensation
Publication number
20190004156
Publication date
Jan 3, 2019
Apple Inc.
Cristiano L. Niclass
G01 - MEASURING TESTING
Information
Patent Application
Multi-range time of flight sensing
Publication number
20180341009
Publication date
Nov 29, 2018
Apple Inc.
Cristiano L. Niclass
G01 - MEASURING TESTING
Information
Patent Application
SPAD Detector Having Modulated Sensitivity
Publication number
20180209846
Publication date
Jul 26, 2018
Apple Inc.
Shingo Mandai
G01 - MEASURING TESTING
Information
Patent Application
Stacked Backside Illuminated SPAD Array
Publication number
20180090526
Publication date
Mar 29, 2018
Apple Inc.
Shingo Mandai
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Stacked Backside Illuminated SPAD Array
Publication number
20180090536
Publication date
Mar 29, 2018
Apple Inc.
Shingo Mandai
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Adaptive transmission power control for a LIDAR
Publication number
20180081061
Publication date
Mar 22, 2018
Apple Inc.
Shingo Mandai
G02 - OPTICS
Information
Patent Application
LiDAR with irregular pulse sequence
Publication number
20180081041
Publication date
Mar 22, 2018
Apple Inc.
Cristiano L. Niclass
G01 - MEASURING TESTING
Information
Patent Application
Radiation source with a small-angle scanning array
Publication number
20180062345
Publication date
Mar 1, 2018
Apple Inc.
Richard E. Bills
G02 - OPTICS
Information
Patent Application
Light detection and ranging sensor
Publication number
20170176579
Publication date
Jun 22, 2017
Apple Inc.
Cristiano L. Niclass
G01 - MEASURING TESTING