Cristina Plettner

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Koln, DE

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Patents Grantslast 30 patents

Information Patent Grant
Dual-range photon detector
- Patent number 8,212,221
- Issue date Jul 3, 2012
- ICx Technologies GmbH
- Jürgen Stein
- G01 - MEASURING TESTING
Information Patent Grant
Particle emission analysis for semiconductor fabrication steps
- Patent number 8,158,449
- Issue date Apr 17, 2012
- International Business Machines Corporation
- Cyril Cabral, Jr.
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DUAL-RANGE PHOTON DETECTOR
- Publication number 20100200762
- Publication date Aug 12, 2010
- Jürgen Stein
- G01 - MEASURING TESTING
Information Patent Application
PARTICLE EMISSION ANALYSIS FOR SEMICONDUCTOR FABRICATION STEPS
- Publication number 20100084656
- Publication date Apr 8, 2010
- Cyril Cabral, JR.
- G01 - MEASURING TESTING
Information Patent Application
LARGE-AREA ALPHA-PARTICLE DETECTOR AND METHOD FOR USE
- Publication number 20090039270
- Publication date Feb 12, 2009
- Cyril Cabral, JR.
- G01 - MEASURING TESTING