Cuong Le

Person

Morgan Hill, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Thickness estimation using conductively related calibration samples
- Patent number 7,019,519
- Issue date Mar 28, 2006
- Cuong Duy Le
- G01 - MEASURING TESTING
Information Patent Grant
Standalone eddy current measuring system for thickness estimation o...
- Patent number 6,762,604
- Issue date Jul 13, 2004
- Cuong Duy Le
- G01 - MEASURING TESTING
Information Patent Grant
Eddy current measuring system for monitoring and controlling a CMP...
- Patent number 6,741,076
- Issue date May 25, 2004
- Cuong Duy Le
- G01 - MEASURING TESTING
Information Patent Grant
Eddy current measurements of thin-film metal coatings using a selec...
- Patent number 6,549,006
- Issue date Apr 15, 2003
- Cuong Duy Le
- G01 - MEASURING TESTING
Information Patent Grant
Non-contact technique for using an eddy current probe for measuring...
- Patent number 6,407,546
- Issue date Jun 18, 2002
- Cuong Duy Le
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Heatsink for high-power microprocessors
- Publication number 20060215364
- Publication date Sep 28, 2006
- Cuong Duy Le
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Thickness Estimation Using Conductively Related Calibration Samples
- Publication number 20050017712
- Publication date Jan 27, 2005
- Cuong Duy Le
- G01 - MEASURING TESTING
Information Patent Application
Eddy current-capacitance sensor for conducting film characterization
- Publication number 20040207395
- Publication date Oct 21, 2004
- Moshe Sarfaty
- G01 - MEASURING TESTING
Information Patent Application
Differential measurement method using eddy-current sensing to resol...
- Publication number 20040070393
- Publication date Apr 15, 2004
- Moshe Sarfaty
- G01 - MEASURING TESTING
Information Patent Application
Eddy current measuring system for monitoring and controlling a chem...
- Publication number 20030210041
- Publication date Nov 13, 2003
- Cuong Duy Le
- G01 - MEASURING TESTING
Information Patent Application
Standalone eddy current measuring system for thickness estimation o...
- Publication number 20030210042
- Publication date Nov 13, 2003
- Cuong Duy Le
- G01 - MEASURING TESTING
Information Patent Application
Integrated eddy current measuring system for monitoring and control...
- Publication number 20030206009
- Publication date Nov 6, 2003
- Cuong Duy Le
- G01 - MEASURING TESTING
Information Patent Application
Eddy current measuring system for monitoring and controlling a phys...
- Publication number 20030206008
- Publication date Nov 6, 2003
- Cuong Duy Le
- G01 - MEASURING TESTING
Information Patent Application
Eddy current measuring system for monitoring and controlling a CMP...
- Publication number 20030201768
- Publication date Oct 30, 2003
- Cuong Duy Le
- G01 - MEASURING TESTING
Information Patent Application
Eddy current test method and appratus for selecting calibration sta...
- Publication number 20020149360
- Publication date Oct 17, 2002
- Cuong Duy Le
- G01 - MEASURING TESTING

Person

Patents Grantslast 30 patents

Thickness estimation using conductively related calibration samples

Standalone eddy current measuring system for thickness estimation o...

Eddy current measuring system for monitoring and controlling a CMP...

Eddy current measurements of thin-film metal coatings using a selec...

Non-contact technique for using an eddy current probe for measuring...

Patents Applicationslast 30 patents

Heatsink for high-power microprocessors

Thickness Estimation Using Conductively Related Calibration Samples

Eddy current-capacitance sensor for conducting film characterization

Differential measurement method using eddy-current sensing to resol...

Eddy current measuring system for monitoring and controlling a chem...

Standalone eddy current measuring system for thickness estimation o...

Integrated eddy current measuring system for monitoring and control...

Eddy current measuring system for monitoring and controlling a phys...

Eddy current measuring system for monitoring and controlling a CMP...

Eddy current test method and appratus for selecting calibration sta...