Cuong Nguyen

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Fort Collins, CO, US

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Patents Grantslast 30 patents

Information Patent Grant
Dual-polarization radar processing system using time domain method
- Patent number 8,665,144
- Issue date Mar 4, 2014
- Colorado State University Research Foundation
- Chandrasekaran Venkatachalam
- G01 - MEASURING TESTING
Information Patent Grant
Sensitivity enhancement system
- Patent number 8,274,423
- Issue date Sep 25, 2012
- Colorado State University Research Foundation
- Chandrasekaran Venkatachalam
- G01 - MEASURING TESTING
Information Patent Grant
Gaussian model adaptive processing in the time domain
- Patent number 8,164,512
- Issue date Apr 24, 2012
- Colorado State University Research Foundation
- Chandrasekaran Venkatachalam
- G01 - MEASURING TESTING
Information Patent Grant
Ground clutter mitigation using a parametric time domain method
- Patent number 7,652,614
- Issue date Jan 26, 2010
- Colorado State University Research Foundation
- Chandrasekaran Venkatachalam
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SENSITIVITY ENHANCEMENT SYSTEM
- Publication number 20110102250
- Publication date May 5, 2011
- Colorado State University Research Foundation
- Chandrasekaran Venkatachalam
- G01 - MEASURING TESTING
Information Patent Application
GAUSSIAN MODEL ADAPTIVE PROCESSING IN THE TIME DOMAIN
- Publication number 20100090884
- Publication date Apr 15, 2010
- Colorado State University Research Foundation
- Chandrasekaran Venkatachalam
- G01 - MEASURING TESTING
Information Patent Application
Dual-polarization radar processing system using time domain method
- Publication number 20090295627
- Publication date Dec 3, 2009
- Colorado State University Research Foundation Technology Transfer
- Chandrasekaran Venkatachalam
- G01 - MEASURING TESTING
Information Patent Application
GROUND CLUTTER MITIGATION USING A PARAMETRIC TIME DOMAIN METHOD
- Publication number 20090033542
- Publication date Feb 5, 2009
- Colorado State University Research Foundation
- Chandrasekaran Venkatachalam
- G01 - MEASURING TESTING