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Hayward, CA, US
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last 30 patents
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Patent Grant
Test size reduction using don't care analysis
Patent number
9,767,412
Issue date
Sep 19, 2017
Fujitsu Limited
Hiroaki Yoshida
G06 - COMPUTING CALCULATING COUNTING
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last 30 patents
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Patent Application
TEST SIZE REDUCTION USING DON'T CARE ANALYSIS
Publication number
20160071012
Publication date
Mar 10, 2016
Fujitsu Limited
Hiroaki YOSHIDA
G06 - COMPUTING CALCULATING COUNTING