Curt H. Chadwick

Person

Los Altos, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for optical inspection of substrates
- Patent number RE37740
- Issue date Jun 11, 2002
- KLA-Tencor Corporation
- Curt H. Chadwick
- 356 - Optics: measuring and testing
Information Patent Grant
Alignment correction prior to image sampling in inspection systems
- Patent number 6,141,038
- Issue date Oct 31, 2000
- KLA Instruments Corporation
- Scott A. Young
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Electron beam inspection system and method
- Patent number 5,502,306
- Issue date Mar 26, 1996
- KLA Instruments Corporation
- Dan Meisburger
- G01 - MEASURING TESTING
Information Patent Grant
Automatic high speed optical inspection system
- Patent number 5,131,755
- Issue date Jul 21, 1992
- Curt H. Chadwick
- G01 - MEASURING TESTING
Information Patent Grant
Automatic high speed optical inspection system
- Patent number 5,085,517
- Issue date Feb 4, 1992
- Curt H. Chadwick
- G01 - MEASURING TESTING
Information Patent Grant
Stable instrument bench with replicated precision surface
- Patent number 5,014,627
- Issue date May 14, 1991
- KLA Instruments Corporation
- Larry Rosenberg
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Method of molding a precision surface on an instrument table
- Patent number 4,889,676
- Issue date Dec 26, 1989
- KLA Instruments Corporation
- Larry Rosenberg
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Method and apparatus for optical inspection of substrates
- Patent number 4,877,326
- Issue date Oct 31, 1989
- KLA Instruments Corporation
- Curt H. Chadwick
- G01 - MEASURING TESTING
Information Patent Grant
Rotational and focusing apparatus for turret mounted lenses
- Patent number 4,647,764
- Issue date Mar 3, 1987
- KLA Instruments Corporation
- Curt H. Chadwick
- G02 - OPTICS
Information Patent Grant
Automatic focusing system for a microscope
- Patent number 4,639,587
- Issue date Jan 27, 1987
- KLA Instruments Corporation
- Curt H. Chadwick
- G02 - OPTICS
Information Patent Grant
Method and apparatus for automatic wafer inspection
- Patent number 4,618,938
- Issue date Oct 21, 1986
- KLA Instruments Corporation
- Paul Sandland
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus for accurately positioning an object at each of two locat...
- Patent number 4,604,910
- Issue date Aug 12, 1986
- KLA Instruments Corporation
- Curt H. Chadwick
- G02 - OPTICS
Information Patent Grant
X-Y Stage for a patterned wafer automatic inspection system
- Patent number 4,556,317
- Issue date Dec 3, 1985
- KLA Instruments Corporation
- Paul Sandland
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Translating mechanism
- Patent number 4,183,483
- Issue date Jan 15, 1980
- GTE Sylvania Incorporated
- Curt H. Chadwick
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...

Patents Applicationslast 30 patents

Information Patent Application
Alignment correction prio to image sampling in inspection systems
- Publication number 20080304734
- Publication date Dec 11, 2008
- KLA INSTRUMENTS CORPORATION
- Scott A. Young
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Alignment correction prior to image sampling in inspection systems
- Publication number 20050254698
- Publication date Nov 17, 2005
- KLA INSTRUMENTS CORPORATION
- Scott A. Young
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Alignment correction prior to image sampling in inspection systems
- Publication number 20030063190
- Publication date Apr 3, 2003
- KLA INSTRUMENTS CORPORATION
- Scott A. Young
- G01 - MEASURING TESTING
Information Patent Application
Alignment correction prior to image sampling in inspection systems
- Publication number 20020075385
- Publication date Jun 20, 2002
- KLA INSTRUMENTS CORPORATION
- Scott A. Young
- G01 - MEASURING TESTING

Curt H. Chadwick

Person

Patents Grantslast 30 patents

Method and apparatus for optical inspection of substrates

Alignment correction prior to image sampling in inspection systems

Electron beam inspection system and method

Automatic high speed optical inspection system

Automatic high speed optical inspection system

Stable instrument bench with replicated precision surface

Method of molding a precision surface on an instrument table

Method and apparatus for optical inspection of substrates

Rotational and focusing apparatus for turret mounted lenses

Automatic focusing system for a microscope

Method and apparatus for automatic wafer inspection

Apparatus for accurately positioning an object at each of two locat...

X-Y Stage for a patterned wafer automatic inspection system

Translating mechanism

Patents Applicationslast 30 patents

Alignment correction prio to image sampling in inspection systems

Alignment correction prior to image sampling in inspection systems

Alignment correction prior to image sampling in inspection systems

Alignment correction prior to image sampling in inspection systems