Curtis C. Hainds

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Colorado Springs, CO, US

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Patents Grantslast 30 patents

Information Patent Grant
S-parameter measurement system for wideband non-linear networks
- Patent number 6,594,604
- Issue date Jul 15, 2003
- Credence Systems Corporation
- Donald M. Metzger
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor wafer having a layer-to-layer alignment mark and meth...
- Patent number 6,288,454
- Issue date Sep 11, 2001
- LSI Logic Corporation
- Derryl D. J. Allman
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Semiconductor wafer having a layer-to-layer alignment mark and meth...
- Patent number 6,136,662
- Issue date Oct 24, 2000
- LSI Logic Corporation
- Derryl D. J. Allman
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
Multi-type test interface system and method
- Publication number 20080238461
- Publication date Oct 2, 2008
- Ken Skala
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
S-parameter measurement system for wideband non-linear networks
- Publication number 20010004729
- Publication date Jun 21, 2001
- Donald M. Metzger
- G01 - MEASURING TESTING