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Curtis H. Rahn
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Plymouth, MN, US
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Patents Grants
last 30 patents
Information
Patent Grant
Integrated SOI pressure sensor having silicon stress isolation member
Patent number
10,151,647
Issue date
Dec 11, 2018
Honeywell International Inc.
Gregory C. Brown
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Apparatus and processes for silicon on insulator MEMS pressure sensors
Patent number
8,813,580
Issue date
Aug 26, 2014
Honeywell International Inc.
Gregory C. Brown
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Electronic pH sensor die packaging
Patent number
8,536,626
Issue date
Sep 17, 2013
Honeywell International Inc.
Gregory C. Brown
G01 - MEASURING TESTING
Information
Patent Grant
Modular pressure sensor
Patent number
8,065,917
Issue date
Nov 29, 2011
Honeywell International Inc.
Gregory C. Brown
G01 - MEASURING TESTING
Information
Patent Grant
Pressure-sensor apparatus
Patent number
7,698,951
Issue date
Apr 20, 2010
Honeywell International Inc.
Gregory C. Brown
G01 - MEASURING TESTING
Information
Patent Grant
Isolation scheme for reducing film stress in a MEMS device
Patent number
7,514,285
Issue date
Apr 7, 2009
Honeywell International Inc.
Gregory C. Brown
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Method and structure of ion implanted elements for the optimization...
Patent number
7,381,582
Issue date
Jun 3, 2008
Honeywell International Inc.
Russell L. Johnson
G01 - MEASURING TESTING
Information
Patent Grant
Microelectromechanical device with integrated conductive shield
Patent number
6,952,042
Issue date
Oct 4, 2005
Honeywell International, Inc.
Thomas G. Stratton
G01 - MEASURING TESTING
Information
Patent Grant
Radiation hardened field oxide for VLSI sub-micron MOS device
Patent number
6,225,178
Issue date
May 1, 2001
Honeywell Inc.
Gordon A. Shaw
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for forming variable width isolation structures
Patent number
5,234,861
Issue date
Aug 10, 1993
Honeywell Inc.
Roger L. Roisen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for forming variable width isolation structures
Patent number
5,017,999
Issue date
May 21, 1991
Honeywell Inc.
Roger L. Roisen
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
INTEGRATED SOI PRESSURE SENSOR HAVING SILICON STRESS ISOLATION MEMBER
Publication number
20140374846
Publication date
Dec 25, 2014
Gregory C. Brown
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS AND PROCESSES FOR SILICON ON INSULATOR MEMS PRESSURE SENSORS
Publication number
20130228022
Publication date
Sep 5, 2013
Honeywell International Inc.
Gregory C. Brown
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
ELECTRONIC PH SENSOR DIE PACKAGING
Publication number
20120273845
Publication date
Nov 1, 2012
Honeywell International Inc.
Gregory C. Brown
G01 - MEASURING TESTING
Information
Patent Application
MODULAR PRESSURE SENSOR
Publication number
20110283802
Publication date
Nov 24, 2011
Honeywell International Inc.
Gregory C. Brown
G01 - MEASURING TESTING
Information
Patent Application
PRESSURE-SENSOR APPARATUS
Publication number
20090293628
Publication date
Dec 3, 2009
Honeywell International Inc.
Gregory C. Brown
G01 - MEASURING TESTING
Information
Patent Application
SILICON PRESSURE SENSOR
Publication number
20090120194
Publication date
May 14, 2009
Honeywell International Inc.
Curtis H. Rahn
G01 - MEASURING TESTING
Information
Patent Application
Microelectromechanical device with integrated conductive shield
Publication number
20070243654
Publication date
Oct 18, 2007
Honeywell International Inc.
Thomas G. Stratton
G01 - MEASURING TESTING
Information
Patent Application
Isolation scheme for reducing film stress in a MEMS device
Publication number
20070164379
Publication date
Jul 19, 2007
Honeywell International Inc.
Gregory C. Brown
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
Method and structure of ion implanted elements for the optimization...
Publication number
20070111355
Publication date
May 17, 2007
Honeywell International Inc.
Russell L. Johnson
G01 - MEASURING TESTING
Information
Patent Application
Microelectromechanical device with integrated conductive shield
Publication number
20030230147
Publication date
Dec 18, 2003
Honeywell International Inc.
Thomas G. Stratton
G01 - MEASURING TESTING