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Curtis L. Harbert
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Sherman, TX, US
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Patents Grants
last 30 patents
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Patent Grant
Selective trim and wafer testing of integrated circuits
Patent number
6,872,582
Issue date
Mar 29, 2005
Texas Instruments Incorporated
Rex W. Pirkle
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
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Patent Application
Selective trim and wafer testing of integrated circuits
Publication number
20030169064
Publication date
Sep 11, 2003
Rex W. Pirkle
H01 - BASIC ELECTRIC ELEMENTS