Cynthia C. Lee

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Orlando, FL, US

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Patents Grantslast 30 patents

Information Patent Grant
Overlay metrology using scatterometry profiling
- Patent number 6,985,229
- Issue date Jan 10, 2006
- Agere Systems, INC
- Cynthia C. Lee
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Overlay metrology using scatterometry profiling
- Publication number 20030223066
- Publication date Dec 4, 2003
- Cynthia C. Lee
- G01 - MEASURING TESTING
Information Patent Application
Patterned implant metrology
- Publication number 20030184769
- Publication date Oct 2, 2003
- Erik Cho Houge
- G01 - MEASURING TESTING