D. Scott Ackerson

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Windham, NH, US

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Patents Grantslast 30 patents

Information Patent Grant
Multiple channel interferometric surface contour measurement system
- Patent number 7,751,063
- Issue date Jul 6, 2010
- Dimensional Photonics International, Inc.
- Robert F. Dillon
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MULTIPLE CHANNEL INTERFEROMETRIC SURFACE CONTOUR MEASUREMENT SYSTEM
- Publication number 20090324212
- Publication date Dec 31, 2009
- DIMENSIONAL PHOTONICS INTERNATIONAL, INC.
- Robert F. Dillon
- G01 - MEASURING TESTING
Information Patent Application
Multiple Channel Interferometric Surface Contour Measurement System
- Publication number 20080165341
- Publication date Jul 10, 2008
- DIMENSIONAL PHOTONICS INTERNATIONAL, INC.
- Robert F. Dillon
- G01 - MEASURING TESTING