Dae-Gab Chi

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Yongin-si, KR

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Patents Grantslast 30 patents

Information Patent Grant
Method of correcting a position of a prober
- Patent number 8,400,174
- Issue date Mar 19, 2013
- Samsung Electronics Co., Ltd.
- Seung-Yong Oh
- G01 - MEASURING TESTING
Information Patent Grant
Test system of semiconductor device having a handler remote control...
- Patent number 7,408,339
- Issue date Aug 5, 2008
- Samsung Electronics Co., Ltd.
- Ae-Yong Chung
- G01 - MEASURING TESTING
Information Patent Grant
Test system of semiconductor device having a handler remote control...
- Patent number 7,230,417
- Issue date Jun 12, 2007
- Samsung Electronics Co., Ltd.
- Ae-Yong Chung
- G01 - MEASURING TESTING
Information Patent Grant
Method for electrical testing of semiconductor package that detects...
- Patent number 6,960,908
- Issue date Nov 1, 2005
- Samsung Electronics Co., Ltd.
- Ae-yong Chung
- G11 - INFORMATION STORAGE
Information Patent Grant
Method for testing a remnant batch of semiconductor devices
- Patent number 6,922,050
- Issue date Jul 26, 2005
- Samsung Electronics Co., Ltd.
- Ae-yong Chung
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method of correcting a position of a prober
- Publication number 20100194418
- Publication date Aug 5, 2010
- Seung-Yong Oh
- G01 - MEASURING TESTING
Information Patent Application
TEST SYSTEM OF SEMICONDUCTOR DEVICE HAVING A HANDLER REMOTE CONTROL...
- Publication number 20070290707
- Publication date Dec 20, 2007
- Samsung Electronics Co., Ltd.
- Ae-Yong CHUNG
- G01 - MEASURING TESTING
Information Patent Application
Test system of semiconductor device having a handler remote control...
- Publication number 20060158211
- Publication date Jul 20, 2006
- Ae-Yong Chung
- G01 - MEASURING TESTING
Information Patent Application
Method for testing a remnant batch of semiconductor devices
- Publication number 20040253753
- Publication date Dec 16, 2004
- Samsung Electronics Co., Ltd.
- Ae-yong Chung
- G01 - MEASURING TESTING
Information Patent Application
Method for electrical testing of semiconductor package that detects...
- Publication number 20040207387
- Publication date Oct 21, 2004
- Ae-yong Chung
- G01 - MEASURING TESTING