Dae Ik Kim

Person

Fishkill, NY, US

People

Patents Grantslast 30 patents

Information Patent Grant
Frequency-based, active monitoring of reliability of a digital system
- Patent number 8,094,706
- Issue date Jan 10, 2012
- International Business Machines Corporation
- Dae Ik Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Testing processor cores
- Patent number 7,912,670
- Issue date Mar 22, 2011
- International Business Machines Corporation
- Dae Ik Kim
- G01 - MEASURING TESTING
Information Patent Grant
Random number generator with random sampling
- Patent number 7,904,494
- Issue date Mar 8, 2011
- International Business Machines Corporation
- Choongyeun Cho
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Independent processor voltage supply
- Patent number 7,853,808
- Issue date Dec 14, 2010
- International Business Machines Corporation
- Dae Ik Kim
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Circuit structures and methods with BEOL layer(s) configured to blo...
- Patent number 7,821,110
- Issue date Oct 26, 2010
- International Business Machines Corporation
- Dae Ik Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for monitoring reliability of a digital system
- Patent number 7,495,519
- Issue date Feb 24, 2009
- International Business Machines Corporation
- Dae Ik Kim
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for testing processor cores
- Patent number 7,418,368
- Issue date Aug 26, 2008
- International Business Machines Corporation
- Dae Ik Kim
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
CIRCUIT STRUCTURES AND METHODS WITH BEOL LAYER(S) CONFIGURED TO BLO...
- Publication number 20080277773
- Publication date Nov 13, 2008
- International Business Machines Corporation
- Dae Ik KIM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR MONITORING RELIABILITY OF A DIGITAL SYSTEM
- Publication number 20080270049
- Publication date Oct 30, 2008
- International Business Machines Corporation
- Dae Ik KIM
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR TESTING PROCESSOR CORES
- Publication number 20080262777
- Publication date Oct 23, 2008
- International Business Machines Corporation
- Dae Ik Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MONITORING RELIABILITY OF A DIGITAL SYSTEM
- Publication number 20080253437
- Publication date Oct 16, 2008
- International Business Machines Corporation
- Dae Ik KIM
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM FOR TESTING PROCESSOR CORES
- Publication number 20080177506
- Publication date Jul 24, 2008
- International Business Machines Corporation
- Dae Ik Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM FOR INDEPENDENT PROCESSOR VOLTAGE SUPPLY
- Publication number 20080178023
- Publication date Jul 24, 2008
- International Business Machines Corporation
- Dae Ik Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM FOR RANDOM NUMBER GENERATOR WITH RANDOM SAMPLING
- Publication number 20080136697
- Publication date Jun 12, 2008
- International Business Machines Corporation
- Choongyeun Cho
- G06 - COMPUTING CALCULATING COUNTING

Person

Patents Grantslast 30 patents

Frequency-based, active monitoring of reliability of a digital system

Testing processor cores

Random number generator with random sampling

Independent processor voltage supply

Circuit structures and methods with BEOL layer(s) configured to blo...

System and method for monitoring reliability of a digital system

Method and system for testing processor cores

Patents Applicationslast 30 patents

CIRCUIT STRUCTURES AND METHODS WITH BEOL LAYER(S) CONFIGURED TO BLO...

SYSTEM AND METHOD FOR MONITORING RELIABILITY OF A DIGITAL SYSTEM

SYSTEM FOR TESTING PROCESSOR CORES

MONITORING RELIABILITY OF A DIGITAL SYSTEM

METHOD AND SYSTEM FOR TESTING PROCESSOR CORES

METHOD AND SYSTEM FOR INDEPENDENT PROCESSOR VOLTAGE SUPPLY

METHOD AND SYSTEM FOR RANDOM NUMBER GENERATOR WITH RANDOM SAMPLING