Daehoon Han

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Hwaseong-si, KR

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Patents Grantslast 30 patents

Information Patent Grant
Hyperspectral imaging (HSI) apparatus and inspection apparatus incl...
- Patent number 11,898,912
- Issue date Feb 13, 2024
- Samsung Electronics Co., Ltd.
- Sungho Jang
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR MEASUREMENT APPARATUS
- Publication number 20250012556
- Publication date Jan 9, 2025
- Samsung Electronics Co., Ltd.
- Younguk Jin
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR MEASUREMENT APPARATUS
- Publication number 20240230314
- Publication date Jul 11, 2024
- Samsung Electronics Co., Ltd.
- Garam CHOI
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR MEASUREMENT APPARATUS
- Publication number 20240133673
- Publication date Apr 25, 2024
- Samsung Electronics Co., Ltd.
- Garam CHOI
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR MEASUREMENT APPARATUS
- Publication number 20230400404
- Publication date Dec 14, 2023
- Samsung Electronics Co., Ltd.
- Garam Choi
- G01 - MEASURING TESTING
Information Patent Application
HYPERSPECTRAL IMAGING (HSI) APPARATUS AND INSPECTION APPARATUS INCL...
- Publication number 20220170792
- Publication date Jun 2, 2022
- Samsung Electronics Co., Ltd.
- Sungho Jang
- G01 - MEASURING TESTING