Daesuk Kim

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Jeonju, KR

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Patents Grantslast 30 patents

Information Patent Grant
Polarization measurement with interference patterns of high spatial...
- Patent number 11,248,955
- Issue date Feb 15, 2022
- Industrial Cooperation Foundation Chonbuk National University
- Daesuk Kim
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 11,035,790
- Issue date Jun 15, 2021
- Industrial Cooperation Foundation Chonbuk National University
- Daesuk Kim
- G01 - MEASURING TESTING
Information Patent Grant
Method for snapshot interferometric spectrometry
- Patent number 10,132,686
- Issue date Nov 20, 2018
- Industrial Cooperation Foundation Chonbuk National University
- Daesuk Kim
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20200209155
- Publication date Jul 2, 2020
- INDUSTRIAL COOPERATION FOUNDATION CHONBUK NATIONAL UNIVERSITY
- Daesuk KIM
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20200049557
- Publication date Feb 13, 2020
- INDUSTRIAL COOPERATION FOUNDATION CHONBUK NATIONAL UNIVERSITY
- Daesuk KIM
- G01 - MEASURING TESTING