Dag Lindquist

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Penfield, NY, US

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Patents Grantslast 30 patents

Information Patent Grant
Moiré interferometer with overlapping illumination and imag...
- Patent number 6,456,384
- Issue date Sep 24, 2002
- Tropel Corporation
- Andrew W. Kulawiec
- G01 - MEASURING TESTING
Information Patent Grant
Automated optical surface profile measurement system
- Patent number 6,157,450
- Issue date Dec 5, 2000
- Chapman Instruments
- Silvio P. Marchese-Ragona
- G01 - MEASURING TESTING