Dahm YU

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Daejeon, KR

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor package test apparatus and method
- Patent number 12,072,370
- Issue date Aug 27, 2024
- Samsung Electronics Co., Ltd.
- Sung Ok Kim
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method of testing an object within a dry gas environment
- Patent number 11,860,083
- Issue date Jan 2, 2024
- Samsung Electronics Co, Ltd.
- Dahm Yu
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus for testing semiconductor packages and automatic tes...
- Patent number 11,614,483
- Issue date Mar 28, 2023
- Samsung Electronics Co., Ltd.
- Dahm Yu
- G01 - MEASURING TESTING
Information Patent Grant
Test chamber and test apparatus having the same
- Patent number 11,193,970
- Issue date Dec 7, 2021
- Samsung Electronics Co., Ltd.
- Seon-Mi Lee
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TEST DEVICE AND SEMICONDUCTOR MANUFACTURING APPARATUS INCLUDING TES...
- Publication number 20250012854
- Publication date Jan 9, 2025
- Samsung Electronics Co., Ltd.
- Jihyun CHOI
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD OF TESTING AN OBJECT WITHIN A DRY GAS ENVIRONMENT
- Publication number 20220178815
- Publication date Jun 9, 2022
- Samsung Electronics Co., Ltd.
- Dahm Yu
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR PACKAGE TEST APPARATUS AND METHOD
- Publication number 20220057444
- Publication date Feb 24, 2022
- Samsung Electronics Co., Ltd.
- Sung Ok KIM
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUS FOR TESTING SEMICONDUCTOR PACKAGES AND AUTOMATIC TES...
- Publication number 20210325450
- Publication date Oct 21, 2021
- Samsung Electronics Co., Ltd.
- Dahm Yu
- G01 - MEASURING TESTING
Information Patent Application
TEST CHAMBER AND TEST APPARATUS HAVING THE SAME
- Publication number 20200271715
- Publication date Aug 27, 2020
- Korea Advanced Institute of Science and Technology
- Seon-Mi LEE
- G01 - MEASURING TESTING