Dai Fujii

Person

Hitachi-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Inspection apparatus for inspecting patterns of a substrate
- Patent number 8,036,447
- Issue date Oct 11, 2011
- Hitachi High-Technologies Corporation
- Koichi Hayakawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Image processing unit for wafer inspection tool
- Patent number 7,889,911
- Issue date Feb 15, 2011
- Hitachi High-Technologies Corporation
- Michio Nakano
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Image processing unit for wafer inspection tool
- Patent number 7,421,110
- Issue date Sep 2, 2008
- Hitachi High-Technologies Corporation
- Michio Nakano
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Distributed control system and filtering method used in the distrib...
- Patent number 6,996,130
- Issue date Feb 7, 2006
- Hitachi, Ltd.
- Masahiro Ohashi
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Micro-controller for reading out compressed instruction code and pr...
- Patent number 6,986,029
- Issue date Jan 10, 2006
- Hitachi, Ltd.
- Hiromichi Yamada
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Distributed control system and filtering method used in the distrib...
- Patent number 6,957,109
- Issue date Oct 18, 2005
- Hitachi, Ltd.
- Masahiro Ohashi
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Micro-controller for reading out compressed instruction code and pr...
- Patent number 6,915,413
- Issue date Jul 5, 2005
- Hitachi, Ltd.
- Hiromichi Yamada
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Distributed control system and filtering method used in the distrib...
- Patent number 6,708,069
- Issue date Mar 16, 2004
- Hitachi, Ltd.
- Masahiro Ohashi
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Distributed control system and filtering method used in the distrib...
- Patent number 6,681,139
- Issue date Jan 20, 2004
- Hitachi, Ltd.
- Masahiro Ohashi
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Logic compound method and logic compound apparatus
- Patent number 6,609,232
- Issue date Aug 19, 2003
- Hitachi, Ltd.
- Teppei Hirotsu
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Defect Inspection Apparatus
- Publication number 20130050469
- Publication date Feb 28, 2013
- Hitachi High-Technologies Corporation
- Masayuki TAKEZAWA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INSPECTION APPARATUS FOR INSPECTING PATTERNS OF A SUBSTRATE
- Publication number 20100008564
- Publication date Jan 14, 2010
- Hitachi High-Technologies Corporation
- Koichi Hayakawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGE PROCESSING UNIT FOR WAFER INSPECTION TOOL
- Publication number 20080285841
- Publication date Nov 20, 2008
- Michio Nakano
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Inspection apparatus for inspecting patterns of a substrate
- Publication number 20060171593
- Publication date Aug 3, 2006
- Hitachi High-Technologies Corporation
- Koichi Hayakawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Micro-controller for reading out compressed instruction code and pr...
- Publication number 20050198471
- Publication date Sep 8, 2005
- Hitachi, Ltd
- Hiromichi Yamada
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Image processing unit for wafer inspection tool
- Publication number 20040170313
- Publication date Sep 2, 2004
- Michio Nakano
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Distributed control system and filtering method used in the distrib...
- Publication number 20040153174
- Publication date Aug 5, 2004
- Masahiro Ohashi
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Micro-controller for reading out compressed instruction code and pr...
- Publication number 20030033482
- Publication date Feb 13, 2003
- Hitachi, Ltd.
- Hiromichi Yamada
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Micro-controller for reading out compressed instruction code and pr...
- Publication number 20030033504
- Publication date Feb 13, 2003
- Hiromichi Yamada
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Distributed control system and filtering method used in the distrib...
- Publication number 20020188659
- Publication date Dec 12, 2002
- Masahiro Ohashi
- C04 - CEMENTS CONCRETE ARTIFICIAL STONE CERAMICS REFRACTORIES
Information Patent Application
Distributed control system and filtering method used in the distrib...
- Publication number 20020188658
- Publication date Dec 12, 2002
- Masahiro Ohashi
- C04 - CEMENTS CONCRETE ARTIFICIAL STONE CERAMICS REFRACTORIES
Information Patent Application
DMA controller and automatic DMA controller generating apparatus
- Publication number 20020174272
- Publication date Nov 21, 2002
- Dai Fujii
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Logic compound method and logic compound apparatus
- Publication number 20010056568
- Publication date Dec 27, 2001
- Teppei Hirotsu
- G06 - COMPUTING CALCULATING COUNTING

Person

Patents Grantslast 30 patents

Inspection apparatus for inspecting patterns of a substrate

Image processing unit for wafer inspection tool

Image processing unit for wafer inspection tool

Distributed control system and filtering method used in the distrib...

Micro-controller for reading out compressed instruction code and pr...

Distributed control system and filtering method used in the distrib...

Micro-controller for reading out compressed instruction code and pr...

Distributed control system and filtering method used in the distrib...

Distributed control system and filtering method used in the distrib...

Logic compound method and logic compound apparatus

Patents Applicationslast 30 patents

Defect Inspection Apparatus

INSPECTION APPARATUS FOR INSPECTING PATTERNS OF A SUBSTRATE

IMAGE PROCESSING UNIT FOR WAFER INSPECTION TOOL

Inspection apparatus for inspecting patterns of a substrate

Micro-controller for reading out compressed instruction code and pr...

Image processing unit for wafer inspection tool

Distributed control system and filtering method used in the distrib...

Micro-controller for reading out compressed instruction code and pr...

Micro-controller for reading out compressed instruction code and pr...

Distributed control system and filtering method used in the distrib...

Distributed control system and filtering method used in the distrib...

DMA controller and automatic DMA controller generating apparatus

Logic compound method and logic compound apparatus