Dai-Jin YEH

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Hsinchu County, TW

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Patents Grantslast 30 patents

Information Patent Grant
Wafer testing probe card
- Patent number 9,823,272
- Issue date Nov 21, 2017
- MPI CORPORATION
- Ming-Chi Chen
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
WAFER TESTING PROBE CARD
- Publication number 20140210505
- Publication date Jul 31, 2014
- MPI Corporation
- Ming-Chi CHEN
- G01 - MEASURING TESTING