Dai SHINOZAKI

Person

Nirasaki-shi Yamanashi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device and heat-dissipating mechanism
- Patent number 9,607,922
- Issue date Mar 28, 2017
- Tanaka Kikinzoku Kogyo K.K.
- Kenji Matsuda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mounting method and mounting device
- Patent number 8,749,068
- Issue date Jun 10, 2014
- Tokyo Electron Limited
- Michikazu Nakamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for evaluating semiconductor device
- Patent number 8,471,585
- Issue date Jun 25, 2013
- Tokyo Electron Limited
- Mitsuyoshi Miyazono
- G01 - MEASURING TESTING
Information Patent Grant
Circuit for protecting DUT, method for protecting DUT, testing appa...
- Patent number 7,701,241
- Issue date Apr 20, 2010
- Tokyo Electron Limited
- Yasunori Kumagai
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus, probe card and inspection method
- Patent number 7,586,317
- Issue date Sep 8, 2009
- Tokyo Electron Limited
- Shigekazu Komatsu
- G01 - MEASURING TESTING
Information Patent Grant
Inspection method and inspection equipment
- Patent number 7,301,357
- Issue date Nov 27, 2007
- Tokyo Electron Limited
- Dai Shinozaki
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE AND HEAT-DISSIPATING MECHANISM
- Publication number 20160049350
- Publication date Feb 18, 2016
- Tanaka Kikinzoku Kogyo K.K.
- Kenji MATSUDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR FORMING SINTERED SILVER COATING FILM, BAKING APPARATUS,...
- Publication number 20140239484
- Publication date Aug 28, 2014
- TOKYO ELECTRON LIMITED
- Kenji MATSUDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MOUNTING METHOD AND MOUNTING DEVICE
- Publication number 20120291950
- Publication date Nov 22, 2012
- TOKYO ELECTRON LIMITED
- Masahiko Sugiyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MOUNTING METHOD AND MOUNTING DEVICE
- Publication number 20120292775
- Publication date Nov 22, 2012
- TOKYO ELECTRON LIMITED
- Michikazu Nakamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for evaluating semiconductor device
- Publication number 20110050269
- Publication date Mar 3, 2011
- TOKYO ELECTRON LIMITED
- Mitsuyoshi Miyazono
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS, PROBE CARD AND INSPECTION METHOD
- Publication number 20090021272
- Publication date Jan 22, 2009
- TOKYO ELECTRON LIMITED
- Shigekazu Komatsu
- G01 - MEASURING TESTING
Information Patent Application
CIRCUIT FOR PROTECTING DUT, METHOD FOR PROTECTING DUT, TESTING APPA...
- Publication number 20070223156
- Publication date Sep 27, 2007
- TOKYO ELECTRON LIMITED
- Yasunori Kumagai
- G01 - MEASURING TESTING
Information Patent Application
Inspection method and inspection equipment
- Publication number 20060061374
- Publication date Mar 23, 2006
- Dai Shinozaki
- G01 - MEASURING TESTING

Dai SHINOZAKI

Person

Patents Grantslast 30 patents

Semiconductor device and heat-dissipating mechanism

Mounting method and mounting device

Method for evaluating semiconductor device

Circuit for protecting DUT, method for protecting DUT, testing appa...

Inspection apparatus, probe card and inspection method

Inspection method and inspection equipment

Patents Applicationslast 30 patents

SEMICONDUCTOR DEVICE AND HEAT-DISSIPATING MECHANISM

METHOD FOR FORMING SINTERED SILVER COATING FILM, BAKING APPARATUS,...

MOUNTING METHOD AND MOUNTING DEVICE

MOUNTING METHOD AND MOUNTING DEVICE

Method for evaluating semiconductor device

INSPECTION APPARATUS, PROBE CARD AND INSPECTION METHOD

CIRCUIT FOR PROTECTING DUT, METHOD FOR PROTECTING DUT, TESTING APPA...

Inspection method and inspection equipment