Daiki Ito

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Kanagawa, JP

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Patents Grantslast 30 patents

Information Patent Grant
Test device and test method of semiconductor storage device
- Patent number 11,037,649
- Issue date Jun 15, 2021
- Winbond Electronics Corp.
- Junichi Hirotsu
- G11 - INFORMATION STORAGE
Information Patent Grant
Information processing apparatus, information processing method, an...
- Patent number 10,282,408
- Issue date May 7, 2019
- Sony Corporation
- Tsunayuki Ohwa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Information processing apparatus, information processing method, an...
- Patent number 9,600,498
- Issue date Mar 21, 2017
- Sony Corporation
- Tsunayuki Ohwa
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
TEST DEVICE AND TEST METHOD OF SEMICONDUCTOR STORAGE DEVICE
- Publication number 20200303032
- Publication date Sep 24, 2020
- WINBOND ELECTRONICS CORP.
- Junichi Hirotsu
- G11 - INFORMATION STORAGE
Information Patent Application
INFORMATION PROCESSING APPARATUS, INFORMATION PROCESSING METHOD, AN...
- Publication number 20170139896
- Publication date May 18, 2017
- SONY CORPORATION
- Tsunayuki OHWA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INFORMATION PROCESSING APPARATUS, INFORMATION PROCESSING METHOD, AN...
- Publication number 20100188421
- Publication date Jul 29, 2010
- Tsunayuki OHWA
- G06 - COMPUTING CALCULATING COUNTING