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Daiki KARINO

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  • Kobe-shi, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Sample processing apparatus
    • Patent number 8,738,182
    • Issue date May 27, 2014
    • SYSMEX CORPORATION
    • Hiroshi Kurono
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    SAMPLE PROCESSING APPARATUS
    • Publication number 20130084212
    • Publication date Apr 4, 2013
    • SYSMEX CORPORATION
    • Hiroshi KURONO
    • G01 - MEASURING TESTING
  • Information Patent Application

    SAMPLE ANALYZER
    • Publication number 20120253693
    • Publication date Oct 4, 2012
    • SYSMEX CORPORATION
    • Norikazu INOMATA
    • G01 - MEASURING TESTING