Daisaku Mochida

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Nagoya-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Polarized light defect detection in pupil images
- Patent number 8,730,465
- Issue date May 20, 2014
- Nikon Corporation
- Kazumasa Endo
- G01 - MEASURING TESTING
Information Patent Grant
Polarized light defect detection in pupil images
- Patent number 8,599,370
- Issue date Dec 3, 2013
- Nikon Corporation
- Kazumasa Endo
Information Patent Grant
Image measuring apparatus
- Patent number 8,120,844
- Issue date Feb 21, 2012
- Nikon Corporation
- Daisaku Mochida
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
Surface inspection apparatus and surface inspection method
- Publication number 20100053603
- Publication date Mar 4, 2010
- Nikon Corporation
- Naoshi Sakaguchi
- G01 - MEASURING TESTING
Information Patent Application
Defect detecting apparatus and defect detecting method
- Publication number 20090147247
- Publication date Jun 11, 2009
- Nikon Corporation
- Kazumasa Endo
- G01 - MEASURING TESTING
Information Patent Application
Mark Position Detection Device, Design Method, and Evaluation Method
- Publication number 20070258624
- Publication date Nov 8, 2007
- Nikon Corporation
- Daisaku Mochida
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY