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Daisuke EBIHARA

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  • Tokyo, JP
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Patents Grantslast 30 patents

Patents Applicationslast 30 patents

  • Information Patent Application

    Automatic Analysis Device
    • Publication number 20240319222
    • Publication date Sep 26, 2024
    • Daisuke EBIHARA
    • G01 - MEASURING TESTING
  • Information Patent Application

    Evaporative Concentration Device and Automatic Analysis Device
    • Publication number 20240310255
    • Publication date Sep 19, 2024
    • Hitachi High-Tech Corporation
    • Daisuke EBIHARA
    • G01 - MEASURING TESTING
  • Information Patent Application

    CONTROL METHOD OF SAMPLE PRETREATMENT APPARATUS
    • Publication number 20230417784
    • Publication date Dec 28, 2023
    • HITACHI HIGH-TECH CORPORATION
    • Akiko SUZUKI
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20230204612
    • Publication date Jun 29, 2023
    • HITACHI HIGH-TECH CORPORATION
    • Akiko Suzuki
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATED ANALYZER
    • Publication number 20230139301
    • Publication date May 4, 2023
    • Hitachi High-Tech Corporation
    • Daisuke EBIHARA
    • G01 - MEASURING TESTING
  • Information Patent Application

    PRETREATMENT METHOD OF AN AUTOMATIC ANALYZER
    • Publication number 20220276270
    • Publication date Sep 1, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Makoto NOGAMI
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYSIS DEVICE
    • Publication number 20220268798
    • Publication date Aug 25, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Daisuke EBIHARA
    • G01 - MEASURING TESTING
  • Information Patent Application

    Automatic Analyzer
    • Publication number 20220065886
    • Publication date Mar 3, 2022
    • Shinya MATSUOKA
    • G01 - MEASURING TESTING
  • Information Patent Application

    ANALYSIS DEVICE HAVING A LIQUID CHROMATOGRAPH AND METHOD FOR ANALYZ...
    • Publication number 20210356443
    • Publication date Nov 18, 2021
    • HITACHI HIGH-TECH CORPORATION
    • Shinya MATSUOKA
    • G01 - MEASURING TESTING
  • Information Patent Application

    Automated Analysis Device
    • Publication number 20210063424
    • Publication date Mar 4, 2021
    • Hitachi High-Tech Corporation
    • Tooru INABA
    • G01 - MEASURING TESTING
  • Information Patent Application

    MAGNETIC SEPARATION METHOD AND AUTOMATED ANALYZER
    • Publication number 20200298251
    • Publication date Sep 24, 2020
    • HITACHI HIGH-TECH CORPORATION
    • Ruochi HSU
    • B03 - SEPARATION OF SOLID MATERIALS USING LIQUIDS OR USING PNEUMATIC TABLES O...
  • Information Patent Application

    Automatic Analyzer and Analysis Method
    • Publication number 20200182754
    • Publication date Jun 11, 2020
    • Hitachi High-Technologies Corporation
    • Daisuke EBIHARA
    • G01 - MEASURING TESTING
  • Information Patent Application

    Automatic Analysis Device
    • Publication number 20190204346
    • Publication date Jul 4, 2019
    • Hitachi High-Technologies Corporation
    • Daisuke EBIHARA
    • G01 - MEASURING TESTING