Daisuke Fukuda

Person

Kawasaki, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Machine learning method
- Patent number 11,836,580
- Issue date Dec 5, 2023
- Fujitsu Limited
- Satoko Iwakura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Computer-readable recording medium and learning data generation method
- Patent number 11,829,867
- Issue date Nov 28, 2023
- Fujitsu Limited
- Satoko Iwakura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Supporting device, design support method and computer-readable reco...
- Patent number 8,856,703
- Issue date Oct 7, 2014
- Fujitsu Limited
- Daisuke Fukuda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Polishing estimation/evaluation device, overpolishing condition cal...
- Patent number 8,667,433
- Issue date Mar 4, 2014
- Fujitsu Limited
- Daisuke Fukuda
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Polishing estimation/evaluation device, overpolishing condition cal...
- Patent number 8,584,059
- Issue date Nov 12, 2013
- Fujitsu Limited
- Daisuke Fukuda
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Polishing estimation/evaluation device, overpolishing condition cal...
- Patent number 8,499,259
- Issue date Jul 30, 2013
- Fujitsu Limited
- Daisuke Fukuda
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Dummy-metal-layout evaluating device and dummy-metal-layout evaluat...
- Patent number 8,356,269
- Issue date Jan 15, 2013
- Fujitsu Limited
- Daisuke Fukuda
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Plated film thickness calculating method and plated film thickness...
- Patent number 8,219,375
- Issue date Jul 10, 2012
- Fujitsu Limited
- Daisuke Fukuda
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Grant
Layout design apparatus, layout design method, and computer product
- Patent number 8,104,008
- Issue date Jan 24, 2012
- Fujitsu Limited
- Daisuke Fukuda
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Semiconductor integrated circuit manufacturing process evaluation m...
- Patent number 8,082,536
- Issue date Dec 20, 2011
- Fujitsu Limited
- Daisuke Fukuda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Film thickness predicting program, recording medium, film thickness...
- Patent number 7,752,579
- Issue date Jul 6, 2010
- Fujitsu Limited
- Daisuke Fukuda
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Method and apparatus for constructing and optimizing a skew of a cl...
- Patent number 7,406,672
- Issue date Jul 29, 2008
- Fujitsu Limited
- Daisuke Fukuda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for prediction of polishing condition, and com...
- Patent number 7,289,872
- Issue date Oct 30, 2007
- Fujitsu Limited
- Daisuke Fukuda
- B24 - GRINDING POLISHING

Patents Applicationslast 30 patents

Information Patent Application
MACHINE LEARNING METHOD
- Publication number 20200193327
- Publication date Jun 18, 2020
- Fujitsu Limited
- Satoko Iwakura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
COMPUTER-READABLE RECORDING MEDIUM AND LEARNING DATA GENERATION METHOD
- Publication number 20190378011
- Publication date Dec 12, 2019
- Fujitsu Limited
- Satoko IWAKURA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DESIGN SUPPORTING DEVICE, DESIGN SUPPORT METHOD AND COMPUTER-READAB...
- Publication number 20130232461
- Publication date Sep 5, 2013
- Fujitsu Limited
- Daisuke Fukuda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
POLISHING ESTIMATION/EVALUATION DEVICE, OVERPOLISHING CONDITION CAL...
- Publication number 20120323526
- Publication date Dec 20, 2012
- Fujitsu Limited
- Daisuke Fukuda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DUMMY-METAL-LAYOUT EVALUATING DEVICE AND DUMMY-METAL-LAYOUT EVALUAT...
- Publication number 20120047472
- Publication date Feb 23, 2012
- Fujitsu Limited
- Daisuke Fukuda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
POLISHING ESTIMATION/EVALUATION DEVICE, OVERPOLISHING CONDITION CAL...
- Publication number 20110197173
- Publication date Aug 11, 2011
- Fujitsu Limited
- Daisuke Fukuda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ESTIMATION APPARATUS AND ESTIMATION METHOD
- Publication number 20100152875
- Publication date Jun 17, 2010
- FUJITSU LIMITED
- Daisuke Fukuda
- B24 - GRINDING POLISHING
Information Patent Application
PLATED FILM THICKNESS CALCULATING METHOD AND PLATED FILM THICKNESS...
- Publication number 20100042392
- Publication date Feb 18, 2010
- Fujitsu Limited
- Daisuke Fukuda
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Application
SEMICONDUCTOR INTEGRATED CIRCUIT MANUFACTURING PROCESS EVALUATION M...
- Publication number 20090246893
- Publication date Oct 1, 2009
- Fujitsu Limited
- Daisuke Fukuda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Layout design apparatus, layout design method, and computer product
- Publication number 20090113373
- Publication date Apr 30, 2009
- FUJITSU LIMITED
- Daisuke Fukuda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Film thickness predicting program, recording medium, film thickness...
- Publication number 20070300194
- Publication date Dec 27, 2007
- FUJITSU LIMITED
- Daisuke Fukuda
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Method and apparatus for supporting integrated circuit design
- Publication number 20070106970
- Publication date May 10, 2007
- FUJITSU LIMITED
- Daisuke Fukuda
- G06 - COMPUTING CALCULATING COUNTING

Daisuke Fukuda

Person

Patents Grantslast 30 patents

Machine learning method

Computer-readable recording medium and learning data generation method

Supporting device, design support method and computer-readable reco...

Polishing estimation/evaluation device, overpolishing condition cal...

Polishing estimation/evaluation device, overpolishing condition cal...

Polishing estimation/evaluation device, overpolishing condition cal...

Dummy-metal-layout evaluating device and dummy-metal-layout evaluat...

Plated film thickness calculating method and plated film thickness...

Layout design apparatus, layout design method, and computer product

Semiconductor integrated circuit manufacturing process evaluation m...

Film thickness predicting program, recording medium, film thickness...

Method and apparatus for constructing and optimizing a skew of a cl...

Method and apparatus for prediction of polishing condition, and com...

Patents Applicationslast 30 patents

MACHINE LEARNING METHOD

COMPUTER-READABLE RECORDING MEDIUM AND LEARNING DATA GENERATION METHOD

DESIGN SUPPORTING DEVICE, DESIGN SUPPORT METHOD AND COMPUTER-READAB...

POLISHING ESTIMATION/EVALUATION DEVICE, OVERPOLISHING CONDITION CAL...

DUMMY-METAL-LAYOUT EVALUATING DEVICE AND DUMMY-METAL-LAYOUT EVALUAT...

POLISHING ESTIMATION/EVALUATION DEVICE, OVERPOLISHING CONDITION CAL...

ESTIMATION APPARATUS AND ESTIMATION METHOD

PLATED FILM THICKNESS CALCULATING METHOD AND PLATED FILM THICKNESS...

SEMICONDUCTOR INTEGRATED CIRCUIT MANUFACTURING PROCESS EVALUATION M...

Layout design apparatus, layout design method, and computer product

Film thickness predicting program, recording medium, film thickness...

Method and apparatus for supporting integrated circuit design