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Daisuke HASHIZUME
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Tokyo, JP
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Patents Applications
last 30 patents
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Patent Application
RECORDING MEDIUM STORING CONTROL PROGRAM FOR INFORMATION PROCESSING...
Publication number
20240411315
Publication date
Dec 12, 2024
NEC Corporation
Daisuke HASHIZUME
G05 - CONTROLLING REGULATING
Information
Patent Application
INVESTIGATION AREA DETERMINATION DEVICE, INVESTIGATION AREA DETERMI...
Publication number
20240346831
Publication date
Oct 17, 2024
NEC CORPORATION
Chisato SUGAWARA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
DISASTER INVESTIGATION ASSISTANCE DEVICE, DISASTER INVESTIGATION AS...
Publication number
20240346819
Publication date
Oct 17, 2024
NEC Corporation
Nana JUMONJI
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
ROUTE SEARCH DEVICE, ROUTE SEARCH METHOD, AND RECORDING MEDIUM
Publication number
20240337498
Publication date
Oct 10, 2024
NEC Corporation
Chisato SUGAWARA
G01 - MEASURING TESTING
Information
Patent Application
SITUATION DETERMINATION DEVICE, SITUATION DETERMINATION METHOD, AND...
Publication number
20240321087
Publication date
Sep 26, 2024
NEC Corporation
Nana JUMONJI
G08 - SIGNALLING
Information
Patent Application
DISPLACEMENT OUTPUT DEVICE, DISPLACEMENT OUTPUT METHOD, AND RECORDI...
Publication number
20240159890
Publication date
May 16, 2024
NEC Corporation
Shouhei OHNO
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
INFORMATION PROCESSING DEVICE, INFORMATION PROCESSING METHOD, AND N...
Publication number
20240061100
Publication date
Feb 22, 2024
NEC Corporation
Daisuke Hashizume
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
DETERIORATION DETERMINATION DEVICE, DETERIORATION DETERMINATION MET...
Publication number
20240026615
Publication date
Jan 25, 2024
NEC Corporation
Nana JUMONJI
E01 - CONSTRUCTION OF ROADS, RAILWAYS, OR BRIDGES
Information
Patent Application
DETERIORATION ASSESSMENT DEVICE, DETERIORATION ASSESSMENT METHOD, A...
Publication number
20230417902
Publication date
Dec 28, 2023
NEC Corporation
Nana JUMONJI
G01 - MEASURING TESTING