Daisuke HIBINO

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Patents Grantslast 30 patents

Information Patent Grant
Pattern-measuring apparatus and semiconductor-measuring system
- Patent number 10,445,875
- Issue date Oct 15, 2019
- Hitachi High-Technologies Corporation
- Yasutaka Toyoda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern-measuring apparatus and semiconductor-measuring system
- Patent number 9,990,708
- Issue date Jun 5, 2018
- Hitachi High-Technologies Corporation
- Yasutaka Toyoda
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Pattern-Measuring Apparatus and Semiconductor-Measuring System
- Publication number 20180247400
- Publication date Aug 30, 2018
- Hitachi High-Technologies Corporation
- Yasutaka TOYODA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Pattern-Measuring Apparatus and Semiconductor-Measuring System
- Publication number 20160005157
- Publication date Jan 7, 2016
- Hitachi High-Technologies Corporation
- Yasutaka TOYODA
- G01 - MEASURING TESTING