Daisuke IKEDA

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Nagasaki, JP

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Patents Grantslast 30 patents

Information Patent Grant
Test jig for testing electrical characteristics of semiconductor pr...
- Patent number 11,079,426
- Issue date Aug 3, 2021
- Mitsubishi Electric Corporation
- Daisuke Ikeda
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor inspection jig
- Patent number 10,895,586
- Issue date Jan 19, 2021
- Mitsubishi Electric Corporation
- Tetsuya Kitagawa
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TEST JIG FOR TESTING ELECTRICAL CHARACTERISTICS OF SEMICONDUCTOR PR...
- Publication number 20200081055
- Publication date Mar 12, 2020
- Mitsubishi Electric Corporation
- Daisuke IKEDA
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR INSPECTION JIG
- Publication number 20180164344
- Publication date Jun 14, 2018
- Mitsubishi Electric Corporation
- Tetsuya KITAGAWA
- G01 - MEASURING TESTING